SIMS investigations of isotope effects at a processed solid surface

Research output: Contribution to journalArticle

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Abstract

A review of the latest research and the new experimental data obtained by the authors on changes in the isotope composition in the near-surface layers of solids in ion scattering processes, ion sputtering, the secondary ion emission, ion implantation, electrolytic saturation by hydrogen isotopes, thermo-diffusion from external source, and chemical solution action is presented. In all these processes appreciable changes in natural isotopic composition of the near-surface layers have been registered. These changes take place among the secondary emitted and reflected particles also. Investigations of these effects have been made by the methods of secondary ion mass spectrometry (SIMS) and secondary ion energy-mass spectrometry (SIEMS). The many-isotopic samples of molybdenum, nickel implanted in copper, various titanium modifications, thin film titanium-aluminum systems and some others have been used. The general regularities in the changes in the isotope composition by different processes are found. Possible mechanisms of these processes are discussed.

Original languageEnglish
Pages (from-to)202-210
Number of pages9
JournalVacuum
Volume81
Issue number2
DOIs
Publication statusPublished - 20 Sep 2006

Fingerprint

Secondary ion mass spectrometry
solid surfaces
Isotopes
isotope effect
secondary ion mass spectrometry
Ions
surface layers
titanium
isotopes
Titanium
ion emission
hydrogen isotopes
Chemical analysis
secondary emission
ion scattering
regularity
molybdenum
Molybdenum
ion implantation
ions

Keywords

  • Hydrogen sorption
  • Ion implantation
  • Isotopic
  • SIMS
  • Thermo-diffusion

ASJC Scopus subject areas

  • Surfaces, Coatings and Films
  • Condensed Matter Physics
  • Surfaces and Interfaces

Cite this

SIMS investigations of isotope effects at a processed solid surface. / Nikitenkov, N. N.; Kolokolov, Dmitry Yurievich; Chernov, I. P.; Tyurin, Yu I.

In: Vacuum, Vol. 81, No. 2, 20.09.2006, p. 202-210.

Research output: Contribution to journalArticle

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AU - Kolokolov, Dmitry Yurievich

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AU - Tyurin, Yu I.

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N2 - A review of the latest research and the new experimental data obtained by the authors on changes in the isotope composition in the near-surface layers of solids in ion scattering processes, ion sputtering, the secondary ion emission, ion implantation, electrolytic saturation by hydrogen isotopes, thermo-diffusion from external source, and chemical solution action is presented. In all these processes appreciable changes in natural isotopic composition of the near-surface layers have been registered. These changes take place among the secondary emitted and reflected particles also. Investigations of these effects have been made by the methods of secondary ion mass spectrometry (SIMS) and secondary ion energy-mass spectrometry (SIEMS). The many-isotopic samples of molybdenum, nickel implanted in copper, various titanium modifications, thin film titanium-aluminum systems and some others have been used. The general regularities in the changes in the isotope composition by different processes are found. Possible mechanisms of these processes are discussed.

AB - A review of the latest research and the new experimental data obtained by the authors on changes in the isotope composition in the near-surface layers of solids in ion scattering processes, ion sputtering, the secondary ion emission, ion implantation, electrolytic saturation by hydrogen isotopes, thermo-diffusion from external source, and chemical solution action is presented. In all these processes appreciable changes in natural isotopic composition of the near-surface layers have been registered. These changes take place among the secondary emitted and reflected particles also. Investigations of these effects have been made by the methods of secondary ion mass spectrometry (SIMS) and secondary ion energy-mass spectrometry (SIEMS). The many-isotopic samples of molybdenum, nickel implanted in copper, various titanium modifications, thin film titanium-aluminum systems and some others have been used. The general regularities in the changes in the isotope composition by different processes are found. Possible mechanisms of these processes are discussed.

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