Simple free-space method for measurement of dielectric constant by means of diffractive optics with new capabilities

I. V. Minin, Oleg V. Minin, Dmitry O. Golodnikov

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

The monitoring of the composition of materials is an important problem of applied spectroscopy using optical, infrared, microwave and THz wavelength bands. MM and THz waves ensure better spatial resolution than microwaves and they can be used for material testing in media that are opaque for optical and infrared radiation. Whenever dielectric components are used in MM and THz wavebands, a precise knowledge of the dielectric properties of the material is essential. The developments original setups for dielectric material probing simultaneously at several discrete wavelengths within the same local zone are described.

Original languageEnglish
Title of host publication2006 8th International Conference on Actual Problems of Electronic Instrument Engineering Proceedings, APEIE - 2006
Pages13-18
Number of pages6
DOIs
Publication statusPublished - 2006
Externally publishedYes
Event8th International Conference on Actual Problems of Electronic Instrument Engineering, APEIE 2006 - Novosibirsk, Russian Federation
Duration: 26 Sep 200628 Sep 2006

Conference

Conference8th International Conference on Actual Problems of Electronic Instrument Engineering, APEIE 2006
CountryRussian Federation
CityNovosibirsk
Period26.9.0628.9.06

Fingerprint

Diffractive optics
Permittivity
Microwaves
Infrared radiation
Wavelength
Materials testing
Dielectric properties
Monitoring
Chemical analysis

Keywords

  • Diffractive optics
  • Millimeter waves
  • Moisture monitoring

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

Minin, I. V., Minin, O. V., & Golodnikov, D. O. (2006). Simple free-space method for measurement of dielectric constant by means of diffractive optics with new capabilities. In 2006 8th International Conference on Actual Problems of Electronic Instrument Engineering Proceedings, APEIE - 2006 (pp. 13-18). [4292375] https://doi.org/10.1109/APEIE.2006.4292375

Simple free-space method for measurement of dielectric constant by means of diffractive optics with new capabilities. / Minin, I. V.; Minin, Oleg V.; Golodnikov, Dmitry O.

2006 8th International Conference on Actual Problems of Electronic Instrument Engineering Proceedings, APEIE - 2006. 2006. p. 13-18 4292375.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Minin, IV, Minin, OV & Golodnikov, DO 2006, Simple free-space method for measurement of dielectric constant by means of diffractive optics with new capabilities. in 2006 8th International Conference on Actual Problems of Electronic Instrument Engineering Proceedings, APEIE - 2006., 4292375, pp. 13-18, 8th International Conference on Actual Problems of Electronic Instrument Engineering, APEIE 2006, Novosibirsk, Russian Federation, 26.9.06. https://doi.org/10.1109/APEIE.2006.4292375
Minin IV, Minin OV, Golodnikov DO. Simple free-space method for measurement of dielectric constant by means of diffractive optics with new capabilities. In 2006 8th International Conference on Actual Problems of Electronic Instrument Engineering Proceedings, APEIE - 2006. 2006. p. 13-18. 4292375 https://doi.org/10.1109/APEIE.2006.4292375
Minin, I. V. ; Minin, Oleg V. ; Golodnikov, Dmitry O. / Simple free-space method for measurement of dielectric constant by means of diffractive optics with new capabilities. 2006 8th International Conference on Actual Problems of Electronic Instrument Engineering Proceedings, APEIE - 2006. 2006. pp. 13-18
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