Self-bearing membrane exit window with the separate anode for sub-microsecond electron accelerator: Exit window for sub-microsecond e-accelerator

Ivan Egorov, Artem Poloskov, Maksim Serebrennikov, Gennady Remnev

Research output: Contribution to journalArticle

Abstract

A vacuum electron diode of a sub-microsecond pulsed electron accelerator with various cooled air-water exit window designs were tested in single-pulse and high-repetition-rate modes. A well-known exit window construction with metal membrane and supporting grid was tested for 104 electron beam pulses at 10 pps before crashing with vacuum failure. A design with a self-bearing anode-membrane demonstrated 105 pulses durability without vacuum failure at 40 pps but accumulated damage like foil sag, overheating areas and surface discharge marks. The combined design of an exit window with an anode-grid and a self-bearing membrane demonstrated a lifetime of more than 106 beam pulses at 40 pps operation.

Original languageEnglish
Article number109111
JournalVacuum
Volume173
DOIs
Publication statusPublished - Mar 2020

Fingerprint

Bearings (structural)
electron accelerators
Particle accelerators
Anodes
anodes
accelerators
Vacuum
membranes
Membranes
pulses
vacuum
Surface discharges
grids
Metal foil
Electron beams
Diodes
Durability
Metals
durability
foils

Keywords

  • Accelerator exit window
  • Electron beam extraction
  • Output window
  • Sealing membrane
  • Vacuum electron diode

ASJC Scopus subject areas

  • Instrumentation
  • Condensed Matter Physics
  • Surfaces, Coatings and Films

Cite this

@article{2a340b08e0674ecfb36630cd59791712,
title = "Self-bearing membrane exit window with the separate anode for sub-microsecond electron accelerator: Exit window for sub-microsecond e-accelerator",
abstract = "A vacuum electron diode of a sub-microsecond pulsed electron accelerator with various cooled air-water exit window designs were tested in single-pulse and high-repetition-rate modes. A well-known exit window construction with metal membrane and supporting grid was tested for 104 electron beam pulses at 10 pps before crashing with vacuum failure. A design with a self-bearing anode-membrane demonstrated 105 pulses durability without vacuum failure at 40 pps but accumulated damage like foil sag, overheating areas and surface discharge marks. The combined design of an exit window with an anode-grid and a self-bearing membrane demonstrated a lifetime of more than 106 beam pulses at 40 pps operation.",
keywords = "Accelerator exit window, Electron beam extraction, Output window, Sealing membrane, Vacuum electron diode",
author = "Ivan Egorov and Artem Poloskov and Maksim Serebrennikov and Gennady Remnev",
year = "2020",
month = "3",
doi = "10.1016/j.vacuum.2019.109111",
language = "English",
volume = "173",
journal = "Vacuum",
issn = "0042-207X",
publisher = "Elsevier Limited",

}

TY - JOUR

T1 - Self-bearing membrane exit window with the separate anode for sub-microsecond electron accelerator

T2 - Exit window for sub-microsecond e-accelerator

AU - Egorov, Ivan

AU - Poloskov, Artem

AU - Serebrennikov, Maksim

AU - Remnev, Gennady

PY - 2020/3

Y1 - 2020/3

N2 - A vacuum electron diode of a sub-microsecond pulsed electron accelerator with various cooled air-water exit window designs were tested in single-pulse and high-repetition-rate modes. A well-known exit window construction with metal membrane and supporting grid was tested for 104 electron beam pulses at 10 pps before crashing with vacuum failure. A design with a self-bearing anode-membrane demonstrated 105 pulses durability without vacuum failure at 40 pps but accumulated damage like foil sag, overheating areas and surface discharge marks. The combined design of an exit window with an anode-grid and a self-bearing membrane demonstrated a lifetime of more than 106 beam pulses at 40 pps operation.

AB - A vacuum electron diode of a sub-microsecond pulsed electron accelerator with various cooled air-water exit window designs were tested in single-pulse and high-repetition-rate modes. A well-known exit window construction with metal membrane and supporting grid was tested for 104 electron beam pulses at 10 pps before crashing with vacuum failure. A design with a self-bearing anode-membrane demonstrated 105 pulses durability without vacuum failure at 40 pps but accumulated damage like foil sag, overheating areas and surface discharge marks. The combined design of an exit window with an anode-grid and a self-bearing membrane demonstrated a lifetime of more than 106 beam pulses at 40 pps operation.

KW - Accelerator exit window

KW - Electron beam extraction

KW - Output window

KW - Sealing membrane

KW - Vacuum electron diode

UR - http://www.scopus.com/inward/record.url?scp=85076114932&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85076114932&partnerID=8YFLogxK

U2 - 10.1016/j.vacuum.2019.109111

DO - 10.1016/j.vacuum.2019.109111

M3 - Article

AN - SCOPUS:85076114932

VL - 173

JO - Vacuum

JF - Vacuum

SN - 0042-207X

M1 - 109111

ER -