Selecting Parameters of Detectors When Recognizing Materials Based on the Separation of Soft and Hard X-Ray Components

S. P. Osipov, E. Yu Usachev, S. V. Chakhlov, S. A. Shchetinkin, E. N. Kamysheva

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1 Citation (Scopus)


An approach to choosing the materials and thicknesses of detectors and an intermediate filter is considered in a material recognition method based on single X-raying of a test object with separate detection of soft and hard photons. The approach combines the maximum sensitivity to changes in the effective atomic number and the minimum error of its estimation. An example is given of selecting the parameters of the detectors and intermediate filter for X-ray energies in the range from 100 to 300 keV.

Original languageEnglish
Pages (from-to)797-810
Number of pages14
JournalRussian Journal of Nondestructive Testing
Issue number11
Publication statusPublished - 1 Nov 2018



  • dualenergy method
  • effective atomic number
  • inspection control
  • material recognition
  • X-ray radiation

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

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