Selecting Parameters of Detectors When Recognizing Materials Based on the Separation of Soft and Hard X-Ray Components

S. P. Osipov, E. Yu Usachev, S. V. Chakhlov, S. A. Shchetinkin, E. N. Kamysheva

Research output: Contribution to journalArticle

Abstract

An approach to choosing the materials and thicknesses of detectors and an intermediate filter is considered in a material recognition method based on single X-raying of a test object with separate detection of soft and hard photons. The approach combines the maximum sensitivity to changes in the effective atomic number and the minimum error of its estimation. An example is given of selecting the parameters of the detectors and intermediate filter for X-ray energies in the range from 100 to 300 keV.

Original languageEnglish
Pages (from-to)797-810
Number of pages14
JournalRussian Journal of Nondestructive Testing
Volume54
Issue number11
DOIs
Publication statusPublished - 1 Nov 2018

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Detectors
filters
X rays
detectors
x rays
Photons
sensitivity
photons
energy

Keywords

  • dualenergy method
  • effective atomic number
  • inspection control
  • material recognition
  • X-ray radiation

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

Cite this

Selecting Parameters of Detectors When Recognizing Materials Based on the Separation of Soft and Hard X-Ray Components. / Osipov, S. P.; Usachev, E. Yu; Chakhlov, S. V.; Shchetinkin, S. A.; Kamysheva, E. N.

In: Russian Journal of Nondestructive Testing, Vol. 54, No. 11, 01.11.2018, p. 797-810.

Research output: Contribution to journalArticle

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