Secure communication for separated and integrated receiver architectures in SWIPT

Furqan Jameel, Dushantha Nalin K. Jayakody, Mark F. Flanagan, Chintha Tellambura

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

This paper investigates the outage probability of the achievable secrecy rate in the presence of multiple eavesdroppers that employ energy harvesting (EH) and information decoding (ID). We derive the theoretical outage probability of the achievable secrecy rate between the legitimate transmitter and receiver pair when both the main channel and wiretap channel experience Rician fading. This work also considers both ideal and imperfect channel state information as well as different EH architectures (i.e. separated and integrated receiver architecture) in the secrecy analysis. Furthermore, the use of transmit antenna selection (TAS) for enhancing message confidentiality is also studied. Numerical and simulation results are provided to validate our analysis.

Original languageEnglish
Title of host publication2018 IEEE Wireless Communications and Networking Conference, WCNC 2018
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1-6
Number of pages6
Volume2018-April
ISBN (Electronic)9781538617342
DOIs
Publication statusPublished - 8 Jun 2018
Event2018 IEEE Wireless Communications and Networking Conference, WCNC 2018 - Barcelona, Spain
Duration: 15 Apr 201818 Apr 2018

Conference

Conference2018 IEEE Wireless Communications and Networking Conference, WCNC 2018
CountrySpain
CityBarcelona
Period15.4.1818.4.18

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Keywords

  • Achievable secrecy rate
  • Outage probability
  • Rician fading
  • Transmit antenna selection (TAS)

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Jameel, F., Jayakody, D. N. K., Flanagan, M. F., & Tellambura, C. (2018). Secure communication for separated and integrated receiver architectures in SWIPT. In 2018 IEEE Wireless Communications and Networking Conference, WCNC 2018 (Vol. 2018-April, pp. 1-6). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/WCNC.2018.8377127