Scaling effects in structural-phase self-organization at the "thin film - substrate" interface

V. E. Panin, A. V. Panin, Victor Petrovich Sergeev, A. R. Shugurov

Research output: Contribution to journalArticle

12 Citations (Scopus)

Abstract

The paper demonstrates that at the "thin film - substrate" interface there occurs structural self-organization that reveals two levels of structural-phase scaling. The levels are governed by the formation of cluster and cellular mesostructures. We discuss the nature of structural-phase self-organization, the commonness of the obtained results and their importance for scientific and engineering applications.

Original languageEnglish
Pages (from-to)117-128
Number of pages12
JournalPhysical Mesomechanics
Volume10
Issue number3-4
DOIs
Publication statusPublished - 2007

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scaling
Thin films
Substrates
thin films
engineering

ASJC Scopus subject areas

  • Mechanics of Materials
  • Materials Science(all)
  • Condensed Matter Physics
  • Surfaces and Interfaces

Cite this

Scaling effects in structural-phase self-organization at the "thin film - substrate" interface. / Panin, V. E.; Panin, A. V.; Sergeev, Victor Petrovich; Shugurov, A. R.

In: Physical Mesomechanics, Vol. 10, No. 3-4, 2007, p. 117-128.

Research output: Contribution to journalArticle

@article{59c4608ef2ca4fd3bd570706274f0f4f,
title = "Scaling effects in structural-phase self-organization at the {"}thin film - substrate{"} interface",
abstract = "The paper demonstrates that at the {"}thin film - substrate{"} interface there occurs structural self-organization that reveals two levels of structural-phase scaling. The levels are governed by the formation of cluster and cellular mesostructures. We discuss the nature of structural-phase self-organization, the commonness of the obtained results and their importance for scientific and engineering applications.",
author = "Panin, {V. E.} and Panin, {A. V.} and Sergeev, {Victor Petrovich} and Shugurov, {A. R.}",
year = "2007",
doi = "10.1016/j.physme.2007.08.001",
language = "English",
volume = "10",
pages = "117--128",
journal = "Physical Mesomechanics",
issn = "1029-9599",
publisher = "Springer Science + Business Media",
number = "3-4",

}

TY - JOUR

T1 - Scaling effects in structural-phase self-organization at the "thin film - substrate" interface

AU - Panin, V. E.

AU - Panin, A. V.

AU - Sergeev, Victor Petrovich

AU - Shugurov, A. R.

PY - 2007

Y1 - 2007

N2 - The paper demonstrates that at the "thin film - substrate" interface there occurs structural self-organization that reveals two levels of structural-phase scaling. The levels are governed by the formation of cluster and cellular mesostructures. We discuss the nature of structural-phase self-organization, the commonness of the obtained results and their importance for scientific and engineering applications.

AB - The paper demonstrates that at the "thin film - substrate" interface there occurs structural self-organization that reveals two levels of structural-phase scaling. The levels are governed by the formation of cluster and cellular mesostructures. We discuss the nature of structural-phase self-organization, the commonness of the obtained results and their importance for scientific and engineering applications.

UR - http://www.scopus.com/inward/record.url?scp=42049122500&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=42049122500&partnerID=8YFLogxK

U2 - 10.1016/j.physme.2007.08.001

DO - 10.1016/j.physme.2007.08.001

M3 - Article

AN - SCOPUS:42049122500

VL - 10

SP - 117

EP - 128

JO - Physical Mesomechanics

JF - Physical Mesomechanics

SN - 1029-9599

IS - 3-4

ER -