Scaling effects in structural-phase self-organization at the "thin film - substrate" interface

V. E. Panin, A. V. Panin, Victor Petrovich Sergeev, A. R. Shugurov

Research output: Contribution to journalArticlepeer-review

12 Citations (Scopus)

Abstract

The paper demonstrates that at the "thin film - substrate" interface there occurs structural self-organization that reveals two levels of structural-phase scaling. The levels are governed by the formation of cluster and cellular mesostructures. We discuss the nature of structural-phase self-organization, the commonness of the obtained results and their importance for scientific and engineering applications.

Original languageEnglish
Pages (from-to)117-128
Number of pages12
JournalPhysical Mesomechanics
Volume10
Issue number3-4
DOIs
Publication statusPublished - 2007

ASJC Scopus subject areas

  • Mechanics of Materials
  • Materials Science(all)
  • Condensed Matter Physics
  • Surfaces and Interfaces

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