Review of pulsed thermal NDT: Physical principles, theory and data processing

Vladimir P. Vavilov, Douglas D. Burleigh

Center for Industrial Tomography

Research output: Contribution to journal › Article

Abstract

This paper summarizes the basics of pulsed thermal nondestructive testing (TNDT) including theoretical solutions, data processing algorithms and practical implementation. Typical defects are discussed along with 1D analytical and multi-dimensional numerical solutions. Special emphasis is focused on defect characterization by the use of inverse solutions. A list of TNDT terms is provided. Applications of active TNDT, mainly in the aerospace industry, are discussed briefly, and some trends in the further development of this technique are described.

Original language	English
Pages (from-to)	28-52
Number of pages	25
Journal	NDT and E International
Volume	73
DOIs	https://doi.org/10.1016/j.ndteint.2015.03.003
Publication status	Published - 1 Jul 2015

Fingerprint

Keywords

Image processing
Infrared thermography
Modeling
Pulsed procedure
Thermal nondestructive testing

ASJC Scopus subject areas

Materials Science(all)
Mechanical Engineering
Condensed Matter Physics

Cite this

Vavilov, V. P., & Burleigh, D. D. (2015). Review of pulsed thermal NDT: Physical principles, theory and data processing. NDT and E International, 73, 28-52. https://doi.org/10.1016/j.ndteint.2015.03.003

@article{4d6cc0341bd04f59aa530c3beb4ebc76,

title = "Review of pulsed thermal NDT: Physical principles, theory and data processing",

abstract = "This paper summarizes the basics of pulsed thermal nondestructive testing (TNDT) including theoretical solutions, data processing algorithms and practical implementation. Typical defects are discussed along with 1D analytical and multi-dimensional numerical solutions. Special emphasis is focused on defect characterization by the use of inverse solutions. A list of TNDT terms is provided. Applications of active TNDT, mainly in the aerospace industry, are discussed briefly, and some trends in the further development of this technique are described.",

keywords = "Image processing, Infrared thermography, Modeling, Pulsed procedure, Thermal nondestructive testing",

author = "Vavilov, {Vladimir P.} and Burleigh, {Douglas D.}",

year = "2015",

month = jul

day = "1",

doi = "10.1016/j.ndteint.2015.03.003",

language = "English",

volume = "73",

pages = "28--52",

journal = "NDT and E International",

issn = "0963-8695",

publisher = "Elsevier Limited",

}

TY - JOUR

T1 - Review of pulsed thermal NDT

T2 - Physical principles, theory and data processing

AU - Vavilov, Vladimir P.

AU - Burleigh, Douglas D.

PY - 2015/7/1

Y1 - 2015/7/1

N2 - This paper summarizes the basics of pulsed thermal nondestructive testing (TNDT) including theoretical solutions, data processing algorithms and practical implementation. Typical defects are discussed along with 1D analytical and multi-dimensional numerical solutions. Special emphasis is focused on defect characterization by the use of inverse solutions. A list of TNDT terms is provided. Applications of active TNDT, mainly in the aerospace industry, are discussed briefly, and some trends in the further development of this technique are described.

AB - This paper summarizes the basics of pulsed thermal nondestructive testing (TNDT) including theoretical solutions, data processing algorithms and practical implementation. Typical defects are discussed along with 1D analytical and multi-dimensional numerical solutions. Special emphasis is focused on defect characterization by the use of inverse solutions. A list of TNDT terms is provided. Applications of active TNDT, mainly in the aerospace industry, are discussed briefly, and some trends in the further development of this technique are described.

KW - Image processing

KW - Infrared thermography

KW - Modeling

KW - Pulsed procedure

KW - Thermal nondestructive testing

UR - http://www.scopus.com/inward/record.url?scp=84928736356&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84928736356&partnerID=8YFLogxK

U2 - 10.1016/j.ndteint.2015.03.003

DO - 10.1016/j.ndteint.2015.03.003

M3 - Article

AN - SCOPUS:84928736356

VL - 73

SP - 28

EP - 52

JO - NDT and E International

JF - NDT and E International

SN - 0963-8695

ER -

Access to Document

10.1016/j.ndteint.2015.03.003