Abstract
InAs x P1-x nanowires are promising building blocks for future optoelectronic devices and nanoelectronics. Their structure may vary from nanowire to nanowire, which may influence their average optoelectronic properties. Therefore, it is highly important for their applications to know the average properties of an ensemble of the nanowires. Structural properties of the InAs x P1-x -InP core-shell nanowires were investigated using the coplanar x-ray diffraction performed at a synchrotron facility. Studies of series of symmetric and asymmetric x-ray Bragg reflections allowed us to determine the 26% ± 3% of As chemical composition in the InAs x P1-x core, core-shell relaxation, and the average tilt of the nanowires with respect to the substrate normal. Based on the x-ray diffraction, scanning, and transmission electron microscopy measurements, a model of the core-shell relaxation was proposed. Partial relaxation of the core was attributed to misfit dislocations formed at the core-shell interface and their linear density was estimated to be 3.3 ± 0.3 × 104 cm-1.
| Original language | English |
|---|---|
| Number of pages | 1 |
| Journal | Nanotechnology |
| Volume | 30 |
| Issue number | 50 |
| DOIs | |
| Publication status | Published - 13 Dec 2019 |
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ASJC Scopus subject areas
- Bioengineering
- Chemistry(all)
- Materials Science(all)
- Mechanics of Materials
- Mechanical Engineering
- Electrical and Electronic Engineering
Cite this
Revealing misfit dislocations in InAs x P1-x -InP core-shell nanowires by x-ray diffraction. / Lazarev, Sergey; Göransson, David J.O.; Borgström, Magnus; Messing, Maria E.; Xu, H. Q.; Dzhigaev, Dmitry; Yefanov, Oleksandr M.; Bauer, Sondes; Baumbach, Tilo; Feidenhans'l, Robert; Samuelson, Lars; Vartanyants, Ivan A.
In: Nanotechnology, Vol. 30, No. 50, 13.12.2019.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Revealing misfit dislocations in InAs x P1-x -InP core-shell nanowires by x-ray diffraction
AU - Lazarev, Sergey
AU - Göransson, David J.O.
AU - Borgström, Magnus
AU - Messing, Maria E.
AU - Xu, H. Q.
AU - Dzhigaev, Dmitry
AU - Yefanov, Oleksandr M.
AU - Bauer, Sondes
AU - Baumbach, Tilo
AU - Feidenhans'l, Robert
AU - Samuelson, Lars
AU - Vartanyants, Ivan A.
PY - 2019/12/13
Y1 - 2019/12/13
N2 - InAs x P1-x nanowires are promising building blocks for future optoelectronic devices and nanoelectronics. Their structure may vary from nanowire to nanowire, which may influence their average optoelectronic properties. Therefore, it is highly important for their applications to know the average properties of an ensemble of the nanowires. Structural properties of the InAs x P1-x -InP core-shell nanowires were investigated using the coplanar x-ray diffraction performed at a synchrotron facility. Studies of series of symmetric and asymmetric x-ray Bragg reflections allowed us to determine the 26% ± 3% of As chemical composition in the InAs x P1-x core, core-shell relaxation, and the average tilt of the nanowires with respect to the substrate normal. Based on the x-ray diffraction, scanning, and transmission electron microscopy measurements, a model of the core-shell relaxation was proposed. Partial relaxation of the core was attributed to misfit dislocations formed at the core-shell interface and their linear density was estimated to be 3.3 ± 0.3 × 104 cm-1.
AB - InAs x P1-x nanowires are promising building blocks for future optoelectronic devices and nanoelectronics. Their structure may vary from nanowire to nanowire, which may influence their average optoelectronic properties. Therefore, it is highly important for their applications to know the average properties of an ensemble of the nanowires. Structural properties of the InAs x P1-x -InP core-shell nanowires were investigated using the coplanar x-ray diffraction performed at a synchrotron facility. Studies of series of symmetric and asymmetric x-ray Bragg reflections allowed us to determine the 26% ± 3% of As chemical composition in the InAs x P1-x core, core-shell relaxation, and the average tilt of the nanowires with respect to the substrate normal. Based on the x-ray diffraction, scanning, and transmission electron microscopy measurements, a model of the core-shell relaxation was proposed. Partial relaxation of the core was attributed to misfit dislocations formed at the core-shell interface and their linear density was estimated to be 3.3 ± 0.3 × 104 cm-1.
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UR - http://www.scopus.com/inward/citedby.url?scp=85074307227&partnerID=8YFLogxK
U2 - 10.1088/1361-6528/ab40f1
DO - 10.1088/1361-6528/ab40f1
M3 - Article
C2 - 31480023
AN - SCOPUS:85074307227
VL - 30
JO - Nanotechnology
JF - Nanotechnology
SN - 0957-4484
IS - 50
ER -