Reliability assessment of a 1 MV LTD

J. Leckbee, J. Maenchen, S. Portillo, S. Cordova, I. Molina, D. L. Johnson, A. A. Kim, R. Chavez, D. Ziska

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    20 Citations (Scopus)

    Abstract

    A 1 MV linear transformer driver (LTD) is being tested with a large area e-beam diode load at Sandia National Laboratories (SNL). The experiments will be utilized to determine the repeatability of the output pulse and the reliability of the components. The 1 MV accelerator is being used to determine the feasibility of designing a 6 MV LTD for radiography experiments. The peak voltage, risetime, and pulse width as well as the cavity timing jitter are analyzed to determine the repeatability of the output pulse.

    Original languageEnglish
    Title of host publicationDigest of Technical Papers-IEEE International Pulsed Power Conference
    PublisherInstitute of Electrical and Electronics Engineers Inc.
    Pages132-134
    Number of pages3
    ISBN (Print)078039190X, 9780780391901
    DOIs
    Publication statusPublished - 2007
    Event2005 IEEE Pulsed Power Conference, PPC - Monterey, CA, United States
    Duration: 13 Jun 200517 Jun 2005

    Other

    Other2005 IEEE Pulsed Power Conference, PPC
    CountryUnited States
    CityMonterey, CA
    Period13.6.0517.6.05

    ASJC Scopus subject areas

    • Electrical and Electronic Engineering

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  • Cite this

    Leckbee, J., Maenchen, J., Portillo, S., Cordova, S., Molina, I., Johnson, D. L., Kim, A. A., Chavez, R., & Ziska, D. (2007). Reliability assessment of a 1 MV LTD. In Digest of Technical Papers-IEEE International Pulsed Power Conference (pp. 132-134). [4084169] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/PPC.2005.300524