Reliability assessment of a 1 MV LTD

J. Leckbee, J. Maenchen, S. Portillo, S. Cordova, I. Molina, D. L. Johnson, A. A. Kim, R. Chavez, D. Ziska

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    20 Citations (Scopus)

    Abstract

    A 1 MV linear transformer driver (LTD) is being tested with a large area e-beam diode load at Sandia National Laboratories (SNL). The experiments will be utilized to determine the repeatability of the output pulse and the reliability of the components. The 1 MV accelerator is being used to determine the feasibility of designing a 6 MV LTD for radiography experiments. The peak voltage, risetime, and pulse width as well as the cavity timing jitter are analyzed to determine the repeatability of the output pulse.

    Original languageEnglish
    Title of host publicationDigest of Technical Papers-IEEE International Pulsed Power Conference
    PublisherInstitute of Electrical and Electronics Engineers Inc.
    Pages132-134
    Number of pages3
    ISBN (Print)078039190X, 9780780391901
    DOIs
    Publication statusPublished - 2007
    Event2005 IEEE Pulsed Power Conference, PPC - Monterey, CA, United States
    Duration: 13 Jun 200517 Jun 2005

    Other

    Other2005 IEEE Pulsed Power Conference, PPC
    CountryUnited States
    CityMonterey, CA
    Period13.6.0517.6.05

    Fingerprint

    Timing jitter
    Radiography
    Particle accelerators
    Diodes
    Experiments
    Electric potential

    ASJC Scopus subject areas

    • Electrical and Electronic Engineering

    Cite this

    Leckbee, J., Maenchen, J., Portillo, S., Cordova, S., Molina, I., Johnson, D. L., ... Ziska, D. (2007). Reliability assessment of a 1 MV LTD. In Digest of Technical Papers-IEEE International Pulsed Power Conference (pp. 132-134). [4084169] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/PPC.2005.300524

    Reliability assessment of a 1 MV LTD. / Leckbee, J.; Maenchen, J.; Portillo, S.; Cordova, S.; Molina, I.; Johnson, D. L.; Kim, A. A.; Chavez, R.; Ziska, D.

    Digest of Technical Papers-IEEE International Pulsed Power Conference. Institute of Electrical and Electronics Engineers Inc., 2007. p. 132-134 4084169.

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Leckbee, J, Maenchen, J, Portillo, S, Cordova, S, Molina, I, Johnson, DL, Kim, AA, Chavez, R & Ziska, D 2007, Reliability assessment of a 1 MV LTD. in Digest of Technical Papers-IEEE International Pulsed Power Conference., 4084169, Institute of Electrical and Electronics Engineers Inc., pp. 132-134, 2005 IEEE Pulsed Power Conference, PPC, Monterey, CA, United States, 13.6.05. https://doi.org/10.1109/PPC.2005.300524
    Leckbee J, Maenchen J, Portillo S, Cordova S, Molina I, Johnson DL et al. Reliability assessment of a 1 MV LTD. In Digest of Technical Papers-IEEE International Pulsed Power Conference. Institute of Electrical and Electronics Engineers Inc. 2007. p. 132-134. 4084169 https://doi.org/10.1109/PPC.2005.300524
    Leckbee, J. ; Maenchen, J. ; Portillo, S. ; Cordova, S. ; Molina, I. ; Johnson, D. L. ; Kim, A. A. ; Chavez, R. ; Ziska, D. / Reliability assessment of a 1 MV LTD. Digest of Technical Papers-IEEE International Pulsed Power Conference. Institute of Electrical and Electronics Engineers Inc., 2007. pp. 132-134
    @inproceedings{d793d24828ed488fb0213ba7efab22f4,
    title = "Reliability assessment of a 1 MV LTD",
    abstract = "A 1 MV linear transformer driver (LTD) is being tested with a large area e-beam diode load at Sandia National Laboratories (SNL). The experiments will be utilized to determine the repeatability of the output pulse and the reliability of the components. The 1 MV accelerator is being used to determine the feasibility of designing a 6 MV LTD for radiography experiments. The peak voltage, risetime, and pulse width as well as the cavity timing jitter are analyzed to determine the repeatability of the output pulse.",
    author = "J. Leckbee and J. Maenchen and S. Portillo and S. Cordova and I. Molina and Johnson, {D. L.} and Kim, {A. A.} and R. Chavez and D. Ziska",
    year = "2007",
    doi = "10.1109/PPC.2005.300524",
    language = "English",
    isbn = "078039190X",
    pages = "132--134",
    booktitle = "Digest of Technical Papers-IEEE International Pulsed Power Conference",
    publisher = "Institute of Electrical and Electronics Engineers Inc.",

    }

    TY - GEN

    T1 - Reliability assessment of a 1 MV LTD

    AU - Leckbee, J.

    AU - Maenchen, J.

    AU - Portillo, S.

    AU - Cordova, S.

    AU - Molina, I.

    AU - Johnson, D. L.

    AU - Kim, A. A.

    AU - Chavez, R.

    AU - Ziska, D.

    PY - 2007

    Y1 - 2007

    N2 - A 1 MV linear transformer driver (LTD) is being tested with a large area e-beam diode load at Sandia National Laboratories (SNL). The experiments will be utilized to determine the repeatability of the output pulse and the reliability of the components. The 1 MV accelerator is being used to determine the feasibility of designing a 6 MV LTD for radiography experiments. The peak voltage, risetime, and pulse width as well as the cavity timing jitter are analyzed to determine the repeatability of the output pulse.

    AB - A 1 MV linear transformer driver (LTD) is being tested with a large area e-beam diode load at Sandia National Laboratories (SNL). The experiments will be utilized to determine the repeatability of the output pulse and the reliability of the components. The 1 MV accelerator is being used to determine the feasibility of designing a 6 MV LTD for radiography experiments. The peak voltage, risetime, and pulse width as well as the cavity timing jitter are analyzed to determine the repeatability of the output pulse.

    UR - http://www.scopus.com/inward/record.url?scp=45149122355&partnerID=8YFLogxK

    UR - http://www.scopus.com/inward/citedby.url?scp=45149122355&partnerID=8YFLogxK

    U2 - 10.1109/PPC.2005.300524

    DO - 10.1109/PPC.2005.300524

    M3 - Conference contribution

    AN - SCOPUS:45149122355

    SN - 078039190X

    SN - 9780780391901

    SP - 132

    EP - 134

    BT - Digest of Technical Papers-IEEE International Pulsed Power Conference

    PB - Institute of Electrical and Electronics Engineers Inc.

    ER -