Raman, AFM, and TEM profiling of QD multilayer structures

E. Sheremet, A. Milekhin, R. D. Rodriguez, D. Dmitriev, A. Toropov, A. Gutakovskii, D. Dentel, W. Grünewald, M. Hietschold, D. R.T. Zahn

Research output: Contribution to journal › Article › peer-review

3 Citations (Scopus)

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Chemical Compounds

Engineering & Materials Science