Raman, AFM, and TEM profiling of QD multilayer structures

E. Sheremet, A. Milekhin, R. D. Rodriguez, D. Dmitriev, A. Toropov, A. Gutakovskii, D. Dentel, W. Grünewald, M. Hietschold, D. R.T. Zahn

Research output: Contribution to journalArticlepeer-review

3 Citations (Scopus)

Fingerprint Dive into the research topics of 'Raman, AFM, and TEM profiling of QD multilayer structures'. Together they form a unique fingerprint.

Chemical Compounds

Engineering & Materials Science