Raman, AFM, and TEM profiling of QD multilayer structures

E. Sheremet, A. Milekhin, R. D. Rodriguez, D. Dmitriev, A. Toropov, A. Gutakovskii, D. Dentel, W. Grünewald, M. Hietschold, D. R.T. Zahn

Research output: Contribution to journalArticlepeer-review

3 Citations (Scopus)


Wereport on a combined atomic force microscopy, Raman spectroscopy, and transmission electron microscopy study of InAs/Al(Ga)As and AlAs/InAs quantum dot nanostructures grown by molecular beam epitaxy in the Stranski-Krastanov growth mode on (001)-oriented GaAs substrates. Structure periods of 50 nmand 100 nmwere determined by atomic force microscopy of cleaved as well as ionmilled sample surfaces and were confirmed by high resolution transmission electron microscopy. Spatially resolved Raman spectroscopy analysis of a beveled surface allows profiling the Raman intensity of phonon modes. An optimal access to the spatially dependent changes in the phonon spectra is achieved by polishing the samples at an angle of 5-7 degrees with respect to the original sample surface plane. Such analysis allowed the localization of individual quantum dot layers. This opens a way to the structural characterization of quantum dot multilayers by the combination of atomic force microscopy and Raman spectroscopy.

Original languageEnglish
Article number035003
JournalMaterials Research Express
Issue number3
Publication statusPublished - 1 Mar 2015
Externally publishedYes


  • Atomic force microscopy
  • Profiling
  • Quantum dots
  • Raman spectroscopy
  • Superlattices
  • Transmission electron microscopy

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Biomaterials
  • Surfaces, Coatings and Films
  • Polymers and Plastics
  • Metals and Alloys

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