Quasi-optical material measurements with help of diffractive optics

I. V. Minin, Oleg V. Minin

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The monitoring of the composition of materials is an important problem of applied spectroscopy using optical, infrared, microwave and THz wavelength bands. MM and THz waves ensure better spatial resolution than microwaves and they can be used for material testing in media that are opaque for optical and infrared radiation. Whenever dielectric components are used in MM and THz wavebands, a precise knowledge of the dielectric properties of the material is essential. The developments original setups for dielectric material probing simultaneously at several discrete wavelengths within the same local zone are described.

Original languageEnglish
Title of host publicationIRMMW-THz 2006 - 31st International Conference on Infrared and Millimeter Waves and 14th International Conference on Terahertz Electronics
Pages301
Number of pages1
DOIs
Publication statusPublished - 2006
Externally publishedYes
EventIRMMW-THz 2006 - 31st International Conference on Infrared and Millimeter Waves and 14th International Conference on Terahertz Electronics - Shanghai, China
Duration: 18 Sep 200622 Sep 2006

Conference

ConferenceIRMMW-THz 2006 - 31st International Conference on Infrared and Millimeter Waves and 14th International Conference on Terahertz Electronics
CountryChina
CityShanghai
Period18.9.0622.9.06

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ASJC Scopus subject areas

  • Computer Networks and Communications
  • Electrical and Electronic Engineering

Cite this

Minin, I. V., & Minin, O. V. (2006). Quasi-optical material measurements with help of diffractive optics. In IRMMW-THz 2006 - 31st International Conference on Infrared and Millimeter Waves and 14th International Conference on Terahertz Electronics (pp. 301). [4222243] https://doi.org/10.1109/ICIMW.2006.368509