Abstract
Performance of IR building thermography has reached its limits in analyzing qualitative IR images only. Future progress could be traced in using new thermal pattern characterization algorithms applied both to quantitative static and dynamic IR images.
Original language | English |
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Title of host publication | Proceedings of SPIE - The International Society for Optical Engineering |
Pages | 71-77 |
Number of pages | 7 |
Volume | 3056 |
DOIs | |
Publication status | Published - 1997 |
Event | Thermosense XIX: An International Conference on Thermal Sensing and Imaging Diagnostic Applications - Orlando, FL, United States Duration: 22 Apr 1997 → 22 Apr 1997 |
Other
Other | Thermosense XIX: An International Conference on Thermal Sensing and Imaging Diagnostic Applications |
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Country | United States |
City | Orlando, FL |
Period | 22.4.97 → 22.4.97 |
Keywords
- Defect characterization
- Heat losses
- Infrared thermography
- Steady-state regime
- Thermal resistance
- Transient regime
ASJC Scopus subject areas
- Applied Mathematics
- Computer Science Applications
- Electrical and Electronic Engineering
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics