Abstract
A method for detection of subsurface defects in ZnGeP2 crystals is proposed. Evaluation of this method is performed and experimental results are presented.
Original language | English |
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Pages (from-to) | 1479-1481 |
Number of pages | 3 |
Journal | Russian Physics Journal |
Volume | 58 |
Issue number | 10 |
DOIs | |
Publication status | Published - 1 Feb 2016 |
Externally published | Yes |
Keywords
- Detection of defects
- Optical techniques
- ZnGeP crystals
ASJC Scopus subject areas
- Physics and Astronomy(all)