Properties of nanocrystalline Al-Cu-O films reactively sputtered by DC pulse dual magnetron

J. Blažek, J. Musil, P. Stupka, R. Čerstvý, J. Houška

Research output: Contribution to journalArticle

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Abstract

The article reports on the effect of the addition of copper in the Al 2 O 3 film on its mechanical and optical properties. The Al-Cu-O films were reactively co-sputtered using DC pulse dual magnetron in a mixture of Ar + O 2 . One magnetron was equipped with a pure Al target and the second magnetron with a composed Al/Cu target. The amount of Al and Cu in the Al-Cu-O film was controlled by the length of pulse at the Al/Cu target. The Al-Cu-O films with ≤16 at.% Cu were investigated in detail. The addition of Cu in Al 2 O 3 film strongly influences its structure and mechanical properties. It is shown that (1) the structure of Al-Cu-O film gradually varies with increasing Cu content from γ-Al 2 O 3 at 0 at.% Cu through (Al 8-2x ,Cu 3x )O 12 nanocrystalline solid solution to CuAl 2 O 4 spinel structure, (2) the Al-Cu-O films with ≥3 at.% Cu exhibit (i) relatively high hardness H increasing from ∼15 GPa to ∼20 GPa, (ii) enhanced elastic recovery W e increasing from ∼67% to ∼76% with increasing Cu content from ∼5 to ∼16 at.% Cu and (iii) low values of Young's modulus E* satisfying the ratio H/E* > 0.1 at ≥5 at.% Cu, and (3) highly elastic Al-Cu-O films with H/E* > 0.1 exhibit enhanced resistance to cracking during indentation under high load.

Original languageEnglish
Pages (from-to)1762-1767
Number of pages6
JournalApplied Surface Science
Volume258
Issue number5
DOIs
Publication statusPublished - 15 Dec 2011

Fingerprint

Mechanical properties
Indentation
Copper
Solid solutions
Optical properties
Elastic moduli
Hardness
Recovery
spinell

Keywords

  • Cu addition
  • Elasticity
  • Mechanical properties
  • Pulse reactive sputtering
  • Resistance to cracking

ASJC Scopus subject areas

  • Surfaces, Coatings and Films

Cite this

Properties of nanocrystalline Al-Cu-O films reactively sputtered by DC pulse dual magnetron. / Blažek, J.; Musil, J.; Stupka, P.; Čerstvý, R.; Houška, J.

In: Applied Surface Science, Vol. 258, No. 5, 15.12.2011, p. 1762-1767.

Research output: Contribution to journalArticle

Blažek, J. ; Musil, J. ; Stupka, P. ; Čerstvý, R. ; Houška, J. / Properties of nanocrystalline Al-Cu-O films reactively sputtered by DC pulse dual magnetron. In: Applied Surface Science. 2011 ; Vol. 258, No. 5. pp. 1762-1767.
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