Post - Processing of thermograms in infrared non - Destructive testing — National Research Tomsk Polytechnic University

Abstract

Results of using the standard processing algorithms (spatial filtering, linear and non-linear transformation, histograms etc) to enhance the quality of thermograms in infrared NDT are discussed. More sophisticated algorithms have been developed to suppress the emissivity noise and non-uniform heating-cooling effects. Besides this some new approaches to thermal tomography are presented.

Original language	English
Pages (from-to)	488-495
Number of pages	8
Journal	Proceedings of SPIE - The International Society for Optical Engineering
Volume	1540
DOIs	https://doi.org/10.1117/12.48758
Publication status	Published - 1 Dec 1991
Event	Infrared Technology XVII 1991 - San Diego, United States Duration: 21 Jul 1991 → …

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Computer Science Applications
Applied Mathematics
Electrical and Electronic Engineering

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title = "Post - Processing of thermograms in infrared non - Destructive testing",

abstract = "Results of using the standard processing algorithms (spatial filtering, linear and non-linear transformation, histograms etc) to enhance the quality of thermograms in infrared NDT are discussed. More sophisticated algorithms have been developed to suppress the emissivity noise and non-uniform heating-cooling effects. Besides this some new approaches to thermal tomography are presented.",

author = "Vavilov, {V. P.} and K. Maldague and Saptzin, {V. M.}",

year = "1991",

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AB - Results of using the standard processing algorithms (spatial filtering, linear and non-linear transformation, histograms etc) to enhance the quality of thermograms in infrared NDT are discussed. More sophisticated algorithms have been developed to suppress the emissivity noise and non-uniform heating-cooling effects. Besides this some new approaches to thermal tomography are presented.

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Post - Processing of thermograms in infrared non - Destructive testing

Abstract

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