Possible application of PXR to the beam-divergence measurements

B. N. Kalinin, A. P. Potylitsin, V. A. Verzilov, I. E. Vnukov, I. Endo, M. Harada, T. Kobayashi, T. Kuwamoto, K. Yoshida, M. Muto, H. Nitta

Research output: Contribution to journalArticle

6 Citations (Scopus)

Abstract

The effect of the beam divergence on the parametric X-radiation has been experimentally investigated at NPI, Tomsk, and at INS, Tokyo for the electron energies 600 and 800 MeV, respectively. It has been shown that the crystal-orientation dependence of PXR is sensitive to the beam divergence, suggesting that PXR can offer a simple means for determining the angular divergence of high energy charged particle beams.

Original languageEnglish
Pages (from-to)601-604
Number of pages4
JournalNuclear Inst. and Methods in Physics Research, A
Volume350
Issue number3
DOIs
Publication statusPublished - 1 Nov 1994

    Fingerprint

ASJC Scopus subject areas

  • Instrumentation
  • Nuclear and High Energy Physics

Cite this