Abstract
Positron annihilation and X-ray diffraction analysis have been used to study submicrocrystalline nickel samples prepared by equal channel angular pressing. In the as-prepared samples the positrons are trapped at dislocationtype defects and in vacancy clusters that can include up to 5 vacancies. The study has revealed that the main positron trap centers at the annealing temperature of ΔT= 20°C-180°C are low-angle boundaries enriched by impurities. At ΔT = 180°C-360°C, the trap centers are low-angle boundaries providing the grain growth due to recrystallization in-situ.
Original language | English |
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Title of host publication | AIP Conference Proceedings |
Publisher | American Institute of Physics Inc. |
Pages | 327-330 |
Number of pages | 4 |
Volume | 1623 |
ISBN (Print) | 9780735412606 |
DOIs | |
Publication status | Published - 2014 |
Event | International Conference on Physical Mesomechanics of Multilevel Systems 2014 - Tomsk, Russian Federation Duration: 3 Sep 2014 → 5 Sep 2014 |
Other
Other | International Conference on Physical Mesomechanics of Multilevel Systems 2014 |
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Country | Russian Federation |
City | Tomsk |
Period | 3.9.14 → 5.9.14 |
Keywords
- Annealing
- Dislocations
- Grain boundary
- Low-angle boundary
- Positron annihilation
- Subgrain
- Submicrocrystalline structure
- Vacancy cluster
ASJC Scopus subject areas
- Physics and Astronomy(all)