Abstract
The paper presents physical and technical restrictions of the materials recognition of objects and their fragments using the dual energy method. It is shown that the recognition parameters for materials having different effective atomic numbers are similar within the detected thickness range of target objects. The correlation is shown between the bit capacity of the analog-to-digital converter and the thickness range of objects the materials of which are recognized correctly. The recommendations are given for the expanding the application area of the dual-energy method for the materials recognition.
| Original language | English |
|---|---|
| Pages (from-to) | 13127-13136 |
| Number of pages | 10 |
| Journal | International Journal of Applied Engineering Research |
| Volume | 12 |
| Issue number | 23 |
| Publication status | Published - 2017 |
Keywords
- Analog-to-digital converter
- Customs inspection
- Dual energy method
- Material recognition
- X-ray radiation
ASJC Scopus subject areas
- Engineering(all)
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Osipov, S. P., Chakhlov, S. V., Osipov, O. S., Li, S., Sun, X., Zheng, J., Hu, X., & Zhang, G. (2017). Physical and technical restrictions of materials recognition by the dual high energy X-ray imaging. International Journal of Applied Engineering Research, 12(23), 13127-13136.