Physical and technical restrictions of materials recognition by the dual high energy X-ray imaging

Abstract

The paper presents physical and technical restrictions of the materials recognition of objects and their fragments using the dual energy method. It is shown that the recognition parameters for materials having different effective atomic numbers are similar within the detected thickness range of target objects. The correlation is shown between the bit capacity of the analog-to-digital converter and the thickness range of objects the materials of which are recognized correctly. The recommendations are given for the expanding the application area of the dual-energy method for the materials recognition.

Original language	English
Pages (from-to)	13127-13136
Number of pages	10
Journal	International Journal of Applied Engineering Research
Volume	12
Issue number	23
Publication status	Published - 2017

Keywords

Analog-to-digital converter
Customs inspection
Dual energy method
Material recognition
X-ray radiation

ASJC Scopus subject areas

Engineering(all)

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Physical and technical restrictions of materials recognition by the dual high energy X-ray imaging. / Osipov, Sergei P.; Chakhlov, Sergei V.; Osipov, Oleg S.; Li, Suqi; Sun, Xiaoming; Zheng, Jianbin; Hu, Xiaowei; Zhang, Gaolong.

In: International Journal of Applied Engineering Research, Vol. 12, No. 23, 2017, p. 13127-13136.

Research output: Contribution to journal › Article › peer-review

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keywords = "Analog-to-digital converter, Customs inspection, Dual energy method, Material recognition, X-ray radiation",

author = "Osipov, {Sergei P.} and Chakhlov, {Sergei V.} and Osipov, {Oleg S.} and Suqi Li and Xiaoming Sun and Jianbin Zheng and Xiaowei Hu and Gaolong Zhang",

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AU - Osipov, Sergei P.

AU - Chakhlov, Sergei V.

AU - Osipov, Oleg S.

AU - Li, Suqi

AU - Sun, Xiaoming

AU - Zheng, Jianbin

AU - Hu, Xiaowei

AU - Zhang, Gaolong

PY - 2017

Y1 - 2017

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AB - The paper presents physical and technical restrictions of the materials recognition of objects and their fragments using the dual energy method. It is shown that the recognition parameters for materials having different effective atomic numbers are similar within the detected thickness range of target objects. The correlation is shown between the bit capacity of the analog-to-digital converter and the thickness range of objects the materials of which are recognized correctly. The recommendations are given for the expanding the application area of the dual-energy method for the materials recognition.

KW - Analog-to-digital converter

KW - Customs inspection

KW - Dual energy method

KW - Material recognition

KW - X-ray radiation

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SN - 0973-4562

IS - 23

ER -

Physical and technical restrictions of materials recognition by the dual high energy X-ray imaging

Abstract

Keywords

ASJC Scopus subject areas

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