Peculiarities of SiO2-MxOy (where M - Mn, Fe, Co, Ni) thin films formation

Anton S. Brichkov, Victoria Y. Brichkova, Lidia A. Egorova, Vladimir V. Kozik, Vladimir K. Ivanov

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

    Abstract

    The paper studies the formation of thin-film and disperse SiO2-MxOy systems (where M - Mn, Fe, Co, Ni) synthesized with sol-gel technology. The influence of metal salt on tetraethoxysilane hydrolysis and film-forming solution viscosity is considered. Dependence of the film optical properties on their composition was determined. According to the electronic scanning microscopy, obtained with a secondary electrons detector, the films containing nickel, mangaese and cobalt have homogeneous morphology and contain pores, sized 100 nm-1 μm, evenly distributed on the surface. The pores contain well crystallized metal oxide nanoparticles.

    Original languageEnglish
    Title of host publicationKey Engineering Materials
    PublisherTrans Tech Publications Ltd
    Pages44-48
    Number of pages5
    Volume670
    ISBN (Print)9783038356127
    DOIs
    Publication statusPublished - 2015
    EventInternational Scientific Conference on Multifunctional Chemical Materials and Technologies, MCMT 2015 - Tomsk, Russian Federation
    Duration: 21 May 2015 → 22 May 2015

    Publication series

    NameKey Engineering Materials
    Volume670
    ISSN (Print)10139826

    Other

    OtherInternational Scientific Conference on Multifunctional Chemical Materials and Technologies, MCMT 2015
    CountryRussian Federation
    CityTomsk
    Period21.5.15 → 22.5.15

    Keywords

    • D-metals
    • Film-forming solutions
    • Films
    • NMR 29si
    • Porosity
    • Refraction index
    • Sol-gel
    • Tetraethoxysilane
    • Thermal analysis

    ASJC Scopus subject areas

    • Materials Science(all)
    • Mechanics of Materials
    • Mechanical Engineering

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    • Cite this

    Brichkov, A. S., Brichkova, V. Y., Egorova, L. A., Kozik, V. V., & Ivanov, V. K. (2015). Peculiarities of SiO2-MxOy (where M - Mn, Fe, Co, Ni) thin films formation. In Key Engineering Materials (Vol. 670, pp. 44-48). (Key Engineering Materials; Vol. 670). Trans Tech Publications Ltd. https://doi.org/10.4028/www.scientific.net/KEM.670.44