Parametric x radiation from thick crystals

I. Endo, M. Harada, T. Kobayashi, Y. S. Lee, T. Ohgaki, T. Takahashi, M. Muto, K. Yoshida, H. Nitta, A. P. Potylitsin, V. N. Zabaev, T. Ohba

Research output: Contribution to journalArticlepeer-review

30 Citations (Scopus)


The parametric x radiation from thick Si single crystals with 0.5-5 mm thickness was investigated at an electron energy of 900 MeV. As the crystal thickness increased, both intensity and angular spread reached a plateau after their increase in the thin crystal region, resulting in more brilliant x rays than Feranchuk and Ivashin's prediction [J. Phys. (Paris) 46, 1981 (1985)] for thick crystals. This behavior is consistent with the incoherent model proposed in our previous paper [Phys. Rev. Lett. 70, 3247 (1993)].

Original languageEnglish
Pages (from-to)6305-6308
Number of pages4
JournalPhysical Review E
Issue number6
Publication statusPublished - 1 Jan 1995

ASJC Scopus subject areas

  • Statistical and Nonlinear Physics
  • Mathematical Physics
  • Condensed Matter Physics
  • Physics and Astronomy(all)

Fingerprint Dive into the research topics of 'Parametric x radiation from thick crystals'. Together they form a unique fingerprint.

Cite this