Abstract
The parametric x radiation from thick Si single crystals with 0.5-5 mm thickness was investigated at an electron energy of 900 MeV. As the crystal thickness increased, both intensity and angular spread reached a plateau after their increase in the thin crystal region, resulting in more brilliant x rays than Feranchuk and Ivashin's prediction [J. Phys. (Paris) 46, 1981 (1985)] for thick crystals. This behavior is consistent with the incoherent model proposed in our previous paper [Phys. Rev. Lett. 70, 3247 (1993)].
| Original language | English |
|---|---|
| Pages (from-to) | 6305-6308 |
| Number of pages | 4 |
| Journal | Physical Review E |
| Volume | 51 |
| Issue number | 6 |
| DOIs | |
| Publication status | Published - 1 Jan 1995 |
ASJC Scopus subject areas
- Statistical and Nonlinear Physics
- Mathematical Physics
- Condensed Matter Physics
- Physics and Astronomy(all)
Fingerprint Dive into the research topics of 'Parametric x radiation from thick crystals'. Together they form a unique fingerprint.
Cite this
Endo, I., Harada, M., Kobayashi, T., Lee, Y. S., Ohgaki, T., Takahashi, T., Muto, M., Yoshida, K., Nitta, H., Potylitsin, A. P., Zabaev, V. N., & Ohba, T. (1995). Parametric x radiation from thick crystals. Physical Review E, 51(6), 6305-6308. https://doi.org/10.1103/PhysRevE.51.6305