### Abstract

A new methods of construction and optimization of diffraction optics elements with square zones topology which allow to greatly reduce a sidelobe level by rotating square zones relative to each other are presented. The method of finding maximal of sidelobe level using multiple runs of local search algorithms and zones rotation angles optimization algorithm based on principles of optimizing multiextremal table functions were used. So these elements, for example in microelectronics and THz waveband, can be produced on standard equipment used in chips manufacture.

Original language | English |
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Title of host publication | Proceedings of the 5th IEEE-Russia Conference - 2005 Microwave Electronics: Measurements, Identification, Applications, MEMIA '05 |

Pages | 177-185 |

Number of pages | 9 |

Volume | 2005 |

Publication status | Published - 2005 |

Externally published | Yes |

Event | 5th IEEE International Conference on Microwave Electronics: Measurements, Identification, Applications 2005, MEMIA '05 - Novosibirsk, Russian Federation Duration: 13 Dec 2005 → 15 Dec 2005 |

### Conference

Conference | 5th IEEE International Conference on Microwave Electronics: Measurements, Identification, Applications 2005, MEMIA '05 |
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Country | Russian Federation |

City | Novosibirsk |

Period | 13.12.05 → 15.12.05 |

### Fingerprint

### Keywords

- Diffractive optics
- Multiple runs of local search algorithms
- Sidelobe reduction
- Square zones topology
- THz devices

### ASJC Scopus subject areas

- Engineering(all)

### Cite this

*Proceedings of the 5th IEEE-Russia Conference - 2005 Microwave Electronics: Measurements, Identification, Applications, MEMIA '05*(Vol. 2005, pp. 177-185). [1716982]

**Parameters optimization algorithm of a new type of diffraction optics elements.** / Minin, I. V.; Minin, Oleg V.; Danilov, E. G.; Lbov, G. S.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

*Proceedings of the 5th IEEE-Russia Conference - 2005 Microwave Electronics: Measurements, Identification, Applications, MEMIA '05.*vol. 2005, 1716982, pp. 177-185, 5th IEEE International Conference on Microwave Electronics: Measurements, Identification, Applications 2005, MEMIA '05, Novosibirsk, Russian Federation, 13.12.05.

}

TY - GEN

T1 - Parameters optimization algorithm of a new type of diffraction optics elements

AU - Minin, I. V.

AU - Minin, Oleg V.

AU - Danilov, E. G.

AU - Lbov, G. S.

PY - 2005

Y1 - 2005

N2 - A new methods of construction and optimization of diffraction optics elements with square zones topology which allow to greatly reduce a sidelobe level by rotating square zones relative to each other are presented. The method of finding maximal of sidelobe level using multiple runs of local search algorithms and zones rotation angles optimization algorithm based on principles of optimizing multiextremal table functions were used. So these elements, for example in microelectronics and THz waveband, can be produced on standard equipment used in chips manufacture.

AB - A new methods of construction and optimization of diffraction optics elements with square zones topology which allow to greatly reduce a sidelobe level by rotating square zones relative to each other are presented. The method of finding maximal of sidelobe level using multiple runs of local search algorithms and zones rotation angles optimization algorithm based on principles of optimizing multiextremal table functions were used. So these elements, for example in microelectronics and THz waveband, can be produced on standard equipment used in chips manufacture.

KW - Diffractive optics

KW - Multiple runs of local search algorithms

KW - Sidelobe reduction

KW - Square zones topology

KW - THz devices

UR - http://www.scopus.com/inward/record.url?scp=34047259336&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=34047259336&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:34047259336

SN - 5778205546

SN - 9785778205543

VL - 2005

SP - 177

EP - 185

BT - Proceedings of the 5th IEEE-Russia Conference - 2005 Microwave Electronics: Measurements, Identification, Applications, MEMIA '05

ER -