Optimized hand fabricated AFM probes for simultaneous topographical and electrochemical tapping mode imaging

Raul D. Rodriguez, Agnès Anne, Edmond Cambril, Christophe Demaille

Research output: Contribution to journalArticlepeer-review

16 Citations (Scopus)

Abstract

In this work hybrid AFM-electrochemical (SECM) probes to be used in dynamic atomic force microscopy are presented. These nanosensors are hand fabricated from gold microwires using a simple benchtop method. They display proportions close to commercially available silicon and silicon nitride cantilevers giving comparable performance in terms of resolution and imaging stability. The remarkable characteristic of these hybrid nanosensors is that they allow the coupling of 3D imaging ability and versatility of atomic force microscopy with the power of electrochemical methods. Local measurement of electrochemical-activity of a test sample consisting of gold bands functionalized by redox-labeled nanometer-sized polyethylene glycol chains has been achieved with simultaneous imaging of the 3D surface topography at high resolution. These hybrid AFM-SECM tips are capable of sensing local electrochemical currents down to ~10. fA emphasizing the sensitivity and resolution of this technique.

Original languageEnglish
Pages (from-to)973-981
Number of pages9
JournalUltramicroscopy
Volume111
Issue number8
DOIs
Publication statusPublished - 1 Jul 2011
Externally publishedYes

Keywords

  • AFM-SECM
  • Hand fabricated AFM probes
  • Hybrid AFM probes
  • Scanning electrochemical microscopy
  • Tapping mode imaging

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Instrumentation

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