Abstract
Tin sulfide thin films were prepared by DC magnetron sputtering of a nanostructured SnS target in argon. The obtained samples were analyzed using atomic force microscopy (AFM), radio frequency glow discharge optical emission spectroscopy (RF-GD-OES) and UV-vis spectrophotometry. The thickness, roughness and surface porosity were evaluated using module software for AFM data visualization and analysis Gwyddion. A thin film growth mechanism was suggested based on the analysis of the AFM images.
| Original language | English |
|---|---|
| Pages (from-to) | 483-487 |
| Number of pages | 5 |
| Journal | Chalcogenide Letters |
| Volume | 12 |
| Issue number | 9 |
| Publication status | Published - 2015 |
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Keywords
- Atomic force microscopy
- Magnetron sputtering
- SnS thin films
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Chemistry(all)
- Physics and Astronomy(all)
Cite this
Optical and AFM studies on p-SnS thin films deposited by magnetron sputtering. / An, V.; Dronova, M.; Zakharov, A.
In: Chalcogenide Letters, Vol. 12, No. 9, 2015, p. 483-487.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Optical and AFM studies on p-SnS thin films deposited by magnetron sputtering
AU - An, V.
AU - Dronova, M.
AU - Zakharov, A.
PY - 2015
Y1 - 2015
N2 - Tin sulfide thin films were prepared by DC magnetron sputtering of a nanostructured SnS target in argon. The obtained samples were analyzed using atomic force microscopy (AFM), radio frequency glow discharge optical emission spectroscopy (RF-GD-OES) and UV-vis spectrophotometry. The thickness, roughness and surface porosity were evaluated using module software for AFM data visualization and analysis Gwyddion. A thin film growth mechanism was suggested based on the analysis of the AFM images.
AB - Tin sulfide thin films were prepared by DC magnetron sputtering of a nanostructured SnS target in argon. The obtained samples were analyzed using atomic force microscopy (AFM), radio frequency glow discharge optical emission spectroscopy (RF-GD-OES) and UV-vis spectrophotometry. The thickness, roughness and surface porosity were evaluated using module software for AFM data visualization and analysis Gwyddion. A thin film growth mechanism was suggested based on the analysis of the AFM images.
KW - Atomic force microscopy
KW - Magnetron sputtering
KW - SnS thin films
UR - http://www.scopus.com/inward/record.url?scp=84943616831&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84943616831&partnerID=8YFLogxK
M3 - Article
AN - SCOPUS:84943616831
VL - 12
SP - 483
EP - 487
JO - Chalcogenide Letters
JF - Chalcogenide Letters
SN - 1584-8663
IS - 9
ER -