Optical and AFM studies on p-SnS thin films deposited by magnetron sputtering

V. An, M. Dronova, A. Zakharov

Research output: Contribution to journalArticle

9 Citations (Scopus)

Abstract

Tin sulfide thin films were prepared by DC magnetron sputtering of a nanostructured SnS target in argon. The obtained samples were analyzed using atomic force microscopy (AFM), radio frequency glow discharge optical emission spectroscopy (RF-GD-OES) and UV-vis spectrophotometry. The thickness, roughness and surface porosity were evaluated using module software for AFM data visualization and analysis Gwyddion. A thin film growth mechanism was suggested based on the analysis of the AFM images.

Original languageEnglish
Pages (from-to)483-487
Number of pages5
JournalChalcogenide Letters
Volume12
Issue number9
Publication statusPublished - 2015

Keywords

  • Atomic force microscopy
  • Magnetron sputtering
  • SnS thin films

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Chemistry(all)
  • Physics and Astronomy(all)

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