Optical and AFM studies on p-SnS thin films deposited by magnetron sputtering

Abstract

Tin sulfide thin films were prepared by DC magnetron sputtering of a nanostructured SnS target in argon. The obtained samples were analyzed using atomic force microscopy (AFM), radio frequency glow discharge optical emission spectroscopy (RF-GD-OES) and UV-vis spectrophotometry. The thickness, roughness and surface porosity were evaluated using module software for AFM data visualization and analysis Gwyddion. A thin film growth mechanism was suggested based on the analysis of the AFM images.

Original language	English
Pages (from-to)	483-487
Number of pages	5
Journal	Chalcogenide Letters
Volume	12
Issue number	9
Publication status	Published - 2015

Keywords

Atomic force microscopy
Magnetron sputtering
SnS thin films

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Chemistry(all)
Physics and Astronomy(all)

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title = "Optical and AFM studies on p-SnS thin films deposited by magnetron sputtering",

abstract = "Tin sulfide thin films were prepared by DC magnetron sputtering of a nanostructured SnS target in argon. The obtained samples were analyzed using atomic force microscopy (AFM), radio frequency glow discharge optical emission spectroscopy (RF-GD-OES) and UV-vis spectrophotometry. The thickness, roughness and surface porosity were evaluated using module software for AFM data visualization and analysis Gwyddion. A thin film growth mechanism was suggested based on the analysis of the AFM images.",

keywords = "Atomic force microscopy, Magnetron sputtering, SnS thin films",

author = "V. An and M. Dronova and A. Zakharov",

year = "2015",

language = "English",

volume = "12",

pages = "483--487",

journal = "Chalcogenide Letters",

issn = "1584-8663",

publisher = "National Institute R and D of Materials Physics",

number = "9",

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T1 - Optical and AFM studies on p-SnS thin films deposited by magnetron sputtering

AU - An, V.

AU - Dronova, M.

AU - Zakharov, A.

PY - 2015

Y1 - 2015

N2 - Tin sulfide thin films were prepared by DC magnetron sputtering of a nanostructured SnS target in argon. The obtained samples were analyzed using atomic force microscopy (AFM), radio frequency glow discharge optical emission spectroscopy (RF-GD-OES) and UV-vis spectrophotometry. The thickness, roughness and surface porosity were evaluated using module software for AFM data visualization and analysis Gwyddion. A thin film growth mechanism was suggested based on the analysis of the AFM images.

AB - Tin sulfide thin films were prepared by DC magnetron sputtering of a nanostructured SnS target in argon. The obtained samples were analyzed using atomic force microscopy (AFM), radio frequency glow discharge optical emission spectroscopy (RF-GD-OES) and UV-vis spectrophotometry. The thickness, roughness and surface porosity were evaluated using module software for AFM data visualization and analysis Gwyddion. A thin film growth mechanism was suggested based on the analysis of the AFM images.

KW - Atomic force microscopy

KW - Magnetron sputtering

KW - SnS thin films

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JO - Chalcogenide Letters

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