Optical and AFM studies on p-SnS thin films deposited by magnetron sputtering

V. An, M. Dronova, A. Zakharov

Research output: Contribution to journalArticle

7 Citations (Scopus)

Abstract

Tin sulfide thin films were prepared by DC magnetron sputtering of a nanostructured SnS target in argon. The obtained samples were analyzed using atomic force microscopy (AFM), radio frequency glow discharge optical emission spectroscopy (RF-GD-OES) and UV-vis spectrophotometry. The thickness, roughness and surface porosity were evaluated using module software for AFM data visualization and analysis Gwyddion. A thin film growth mechanism was suggested based on the analysis of the AFM images.

Original languageEnglish
Pages (from-to)483-487
Number of pages5
JournalChalcogenide Letters
Volume12
Issue number9
Publication statusPublished - 2015

Fingerprint

Magnetron sputtering
Atomic force microscopy
magnetron sputtering
atomic force microscopy
Thin films
thin films
scientific visualization
Optical emission spectroscopy
Data visualization
Argon
Spectrophotometry
Glow discharges
optical emission spectroscopy
Film growth
spectrophotometry
glow discharges
Tin
sulfides
tin
radio frequencies

Keywords

  • Atomic force microscopy
  • Magnetron sputtering
  • SnS thin films

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Chemistry(all)
  • Physics and Astronomy(all)

Cite this

Optical and AFM studies on p-SnS thin films deposited by magnetron sputtering. / An, V.; Dronova, M.; Zakharov, A.

In: Chalcogenide Letters, Vol. 12, No. 9, 2015, p. 483-487.

Research output: Contribution to journalArticle

An, V. ; Dronova, M. ; Zakharov, A. / Optical and AFM studies on p-SnS thin films deposited by magnetron sputtering. In: Chalcogenide Letters. 2015 ; Vol. 12, No. 9. pp. 483-487.
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