On using ABC for deriving distinguishing sequences for Verilog-descriptions

Natalia Kushik, Nina Yevtushenko, Stanislav N. Torgaev, Nikita Shatilov

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

In this paper, we discuss how a software ABC can be effectively used to derive distinguishing sequences for Verilog-descriptions. A set of these sequences can serve as a test suite for a digital device that is designed based on the corresponding Verilog-description using the FPGA technology. The paper contains a methodology for such test derivation technique, as well as technical details about the use of the tool and necessary commands. ABC can be easily downloaded from its official web site, and an interested reader can always repeat these experiments or apply this technology for more serious industrial need.

Original languageEnglish
Title of host publicationProceedings of 2015 IEEE East-West Design and Test Symposium, EWDTS 2015
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781467377751
DOIs
Publication statusPublished - 15 Jun 2016
Event2015 IEEE East-West Design and Test Symposium, EWDTS 2015 - Batumi, Georgia
Duration: 26 Sep 201529 Sep 2015

Other

Other2015 IEEE East-West Design and Test Symposium, EWDTS 2015
CountryGeorgia
CityBatumi
Period26.9.1529.9.15

Fingerprint

Computer hardware description languages
Digital devices
Field programmable gate arrays (FPGA)
Websites
Experiments

ASJC Scopus subject areas

  • Computer Networks and Communications
  • Hardware and Architecture
  • Electrical and Electronic Engineering
  • Safety, Risk, Reliability and Quality

Cite this

Kushik, N., Yevtushenko, N., Torgaev, S. N., & Shatilov, N. (2016). On using ABC for deriving distinguishing sequences for Verilog-descriptions. In Proceedings of 2015 IEEE East-West Design and Test Symposium, EWDTS 2015 [7493150] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/EWDTS.2015.7493150

On using ABC for deriving distinguishing sequences for Verilog-descriptions. / Kushik, Natalia; Yevtushenko, Nina; Torgaev, Stanislav N.; Shatilov, Nikita.

Proceedings of 2015 IEEE East-West Design and Test Symposium, EWDTS 2015. Institute of Electrical and Electronics Engineers Inc., 2016. 7493150.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Kushik, N, Yevtushenko, N, Torgaev, SN & Shatilov, N 2016, On using ABC for deriving distinguishing sequences for Verilog-descriptions. in Proceedings of 2015 IEEE East-West Design and Test Symposium, EWDTS 2015., 7493150, Institute of Electrical and Electronics Engineers Inc., 2015 IEEE East-West Design and Test Symposium, EWDTS 2015, Batumi, Georgia, 26.9.15. https://doi.org/10.1109/EWDTS.2015.7493150
Kushik N, Yevtushenko N, Torgaev SN, Shatilov N. On using ABC for deriving distinguishing sequences for Verilog-descriptions. In Proceedings of 2015 IEEE East-West Design and Test Symposium, EWDTS 2015. Institute of Electrical and Electronics Engineers Inc. 2016. 7493150 https://doi.org/10.1109/EWDTS.2015.7493150
Kushik, Natalia ; Yevtushenko, Nina ; Torgaev, Stanislav N. ; Shatilov, Nikita. / On using ABC for deriving distinguishing sequences for Verilog-descriptions. Proceedings of 2015 IEEE East-West Design and Test Symposium, EWDTS 2015. Institute of Electrical and Electronics Engineers Inc., 2016.
@inproceedings{947fbe1d826d4e7f9611ef68cf670473,
title = "On using ABC for deriving distinguishing sequences for Verilog-descriptions",
abstract = "In this paper, we discuss how a software ABC can be effectively used to derive distinguishing sequences for Verilog-descriptions. A set of these sequences can serve as a test suite for a digital device that is designed based on the corresponding Verilog-description using the FPGA technology. The paper contains a methodology for such test derivation technique, as well as technical details about the use of the tool and necessary commands. ABC can be easily downloaded from its official web site, and an interested reader can always repeat these experiments or apply this technology for more serious industrial need.",
author = "Natalia Kushik and Nina Yevtushenko and Torgaev, {Stanislav N.} and Nikita Shatilov",
year = "2016",
month = "6",
day = "15",
doi = "10.1109/EWDTS.2015.7493150",
language = "English",
booktitle = "Proceedings of 2015 IEEE East-West Design and Test Symposium, EWDTS 2015",
publisher = "Institute of Electrical and Electronics Engineers Inc.",

}

TY - GEN

T1 - On using ABC for deriving distinguishing sequences for Verilog-descriptions

AU - Kushik, Natalia

AU - Yevtushenko, Nina

AU - Torgaev, Stanislav N.

AU - Shatilov, Nikita

PY - 2016/6/15

Y1 - 2016/6/15

N2 - In this paper, we discuss how a software ABC can be effectively used to derive distinguishing sequences for Verilog-descriptions. A set of these sequences can serve as a test suite for a digital device that is designed based on the corresponding Verilog-description using the FPGA technology. The paper contains a methodology for such test derivation technique, as well as technical details about the use of the tool and necessary commands. ABC can be easily downloaded from its official web site, and an interested reader can always repeat these experiments or apply this technology for more serious industrial need.

AB - In this paper, we discuss how a software ABC can be effectively used to derive distinguishing sequences for Verilog-descriptions. A set of these sequences can serve as a test suite for a digital device that is designed based on the corresponding Verilog-description using the FPGA technology. The paper contains a methodology for such test derivation technique, as well as technical details about the use of the tool and necessary commands. ABC can be easily downloaded from its official web site, and an interested reader can always repeat these experiments or apply this technology for more serious industrial need.

UR - http://www.scopus.com/inward/record.url?scp=84979255369&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84979255369&partnerID=8YFLogxK

U2 - 10.1109/EWDTS.2015.7493150

DO - 10.1109/EWDTS.2015.7493150

M3 - Conference contribution

BT - Proceedings of 2015 IEEE East-West Design and Test Symposium, EWDTS 2015

PB - Institute of Electrical and Electronics Engineers Inc.

ER -