On the self-testing (m,n)-code checker design

N. Butorina, Yu Burkatovskaya, E. Pakhomova

Research output: Contribution to journalConference articlepeer-review

Abstract

We propose an approach to a self-testing (m, n)-code checker design, based on subdividing the set of all code words into special subsets called segments. The checker circuit is constructed by using one- and two-output configurable logic blocks (CLB). Previously, in each output of a CLB, a function representing exactly one segment was implemented. In the proposed approach, at each CLBs output, it is possible to implement functions that represent several segments and to provide the self-testing property. It allows reducing the number of CLBs and simplifying the circuit of the checker.

Original languageEnglish
Article number012098
JournalIOP Conference Series: Materials Science and Engineering
Volume1019
Issue number1
DOIs
Publication statusPublished - 20 Jan 2021
Event14th International Forum on Strategic Technology, IFOST 2019 - Tomsk, Russian Federation
Duration: 14 Oct 201917 Oct 2019

ASJC Scopus subject areas

  • Materials Science(all)
  • Engineering(all)

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