Abstract
The Laue reflection from a quartz single crystal was experimentally studied in the presence of temperature gradient applied perpendicularly to reflecting atomic planes (10 1 ¯ 1), so that a two-dimensional bending of these planes occurs. It is shown that as a result of such an application of temperature gradient to a crystal, the two-dimensional focusing of reflected X-rays is obtained. With increasing temperature gradient the focus of X-rays approaches the crystal more rapidly in the plane of reflection than in the perpendicular one.
Original language | English |
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Pages (from-to) | 263-269 |
Number of pages | 7 |
Journal | Journal of Contemporary Physics |
Volume | 53 |
Issue number | 3 |
DOIs | |
Publication status | Published - 1 Jul 2018 |
Keywords
- focusing
- quartz
- temperature gradient
- X-ray
ASJC Scopus subject areas
- Physics and Astronomy(all)