Abstract
An on-line control method of crystal deflector quality based on parametric X-ray radiation is proposed. The technique considered will allow information to be received about the state of the deflector crystal structure directly in the local interaction area of the beam and the crystal.
| Original language | English |
|---|---|
| Pages (from-to) | 3876-3880 |
| Number of pages | 5 |
| Journal | Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms |
| Volume | 266 |
| Issue number | 17 |
| DOIs | |
| Publication status | Published - Sep 2008 |
Keywords
- Beam extraction
- Deflector quality
- Parametric X-ray radiation
ASJC Scopus subject areas
- Surfaces, Coatings and Films
- Instrumentation
- Surfaces and Interfaces
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Gogolev, A. S., Potylitsyn, A. P., Taratin, A. M., & Tropin, Y. S. (2008). On-line control of crystal deflector quality. Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, 266(17), 3876-3880. https://doi.org/10.1016/j.nimb.2008.05.007