Observation of spectral line splitting for parametric X-rays

Yu N. Adishchev, G. A. Pleshkov, A. P. Potylitsin, S. R. Uglov, S. A. Vorobiev

Research School of High-Energy Physics

Research output: Contribution to journal › Article

Abstract

The spectral distribution and energy dependence of the yield of parametric X-rays for 200 to 900 MeV electrons transmitted through a silicon crystal have been measured. The measurements were performed in the Bragg geometry at an angle θ = 19° to the electron beam direction. The effect of spectral line splitting for parametric X-rays was observed.

Original language	English
Pages (from-to)	486-488
Number of pages	3
Journal	Physics Letters A
Volume	120
Issue number	9
DOIs	https://doi.org/10.1016/0375-9601(87)90117-4
Publication status	Published - 23 Mar 1987

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ASJC Scopus subject areas

Physics and Astronomy(all)

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Adishchev, Y. N., Pleshkov, G. A., Potylitsin, A. P., Uglov, S. R., & Vorobiev, S. A. (1987). Observation of spectral line splitting for parametric X-rays. Physics Letters A, 120(9), 486-488. https://doi.org/10.1016/0375-9601(87)90117-4

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AU - Pleshkov, G. A.

AU - Potylitsin, A. P.

AU - Uglov, S. R.

AU - Vorobiev, S. A.

PY - 1987/3/23

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N2 - The spectral distribution and energy dependence of the yield of parametric X-rays for 200 to 900 MeV electrons transmitted through a silicon crystal have been measured. The measurements were performed in the Bragg geometry at an angle θ = 19° to the electron beam direction. The effect of spectral line splitting for parametric X-rays was observed.

AB - The spectral distribution and energy dependence of the yield of parametric X-rays for 200 to 900 MeV electrons transmitted through a silicon crystal have been measured. The measurements were performed in the Bragg geometry at an angle θ = 19° to the electron beam direction. The effect of spectral line splitting for parametric X-rays was observed.

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Access to Document

10.1016/0375-9601(87)90117-4