Observation of spectral line splitting for parametric X-rays

Yu N. Adishchev, G. A. Pleshkov, A. P. Potylitsin, S. R. Uglov, S. A. Vorobiev

Research output: Contribution to journalArticle

Abstract

The spectral distribution and energy dependence of the yield of parametric X-rays for 200 to 900 MeV electrons transmitted through a silicon crystal have been measured. The measurements were performed in the Bragg geometry at an angle θ = 19° to the electron beam direction. The effect of spectral line splitting for parametric X-rays was observed.

Original languageEnglish
Pages (from-to)486-488
Number of pages3
JournalPhysics Letters A
Volume120
Issue number9
DOIs
Publication statusPublished - 23 Mar 1987

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line spectra
x rays
electron beams
silicon
geometry
crystals
electrons
energy

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

Observation of spectral line splitting for parametric X-rays. / Adishchev, Yu N.; Pleshkov, G. A.; Potylitsin, A. P.; Uglov, S. R.; Vorobiev, S. A.

In: Physics Letters A, Vol. 120, No. 9, 23.03.1987, p. 486-488.

Research output: Contribution to journalArticle

Adishchev, Yu N. ; Pleshkov, G. A. ; Potylitsin, A. P. ; Uglov, S. R. ; Vorobiev, S. A. / Observation of spectral line splitting for parametric X-rays. In: Physics Letters A. 1987 ; Vol. 120, No. 9. pp. 486-488.
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