Observation of spectral line splitting for parametric X-rays

Yu N. Adishchev, G. A. Pleshkov, A. P. Potylitsin, S. R. Uglov, S. A. Vorobiev

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The spectral distribution and energy dependence of the yield of parametric X-rays for 200 to 900 MeV electrons transmitted through a silicon crystal have been measured. The measurements were performed in the Bragg geometry at an angle θ = 19° to the electron beam direction. The effect of spectral line splitting for parametric X-rays was observed.

Original languageEnglish
Pages (from-to)486-488
Number of pages3
JournalPhysics Letters A
Issue number9
Publication statusPublished - 23 Mar 1987


ASJC Scopus subject areas

  • Physics and Astronomy(all)

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