Abstract
The spectral distribution and energy dependence of the yield of parametric X-rays for 200 to 900 MeV electrons transmitted through a silicon crystal have been measured. The measurements were performed in the Bragg geometry at an angle θ = 19° to the electron beam direction. The effect of spectral line splitting for parametric X-rays was observed.
| Original language | English |
|---|---|
| Pages (from-to) | 486-488 |
| Number of pages | 3 |
| Journal | Physics Letters A |
| Volume | 120 |
| Issue number | 9 |
| DOIs | |
| Publication status | Published - 23 Mar 1987 |
ASJC Scopus subject areas
- Physics and Astronomy(all)
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Cite this
Adishchev, Y. N., Pleshkov, G. A., Potylitsin, A. P., Uglov, S. R., & Vorobiev, S. A. (1987). Observation of spectral line splitting for parametric X-rays. Physics Letters A, 120(9), 486-488. https://doi.org/10.1016/0375-9601(87)90117-4