Abstract
X radiation by 900 MeV electrons in accurately aligned 1-100 layers of 16 μm thick monocrystalline foils of Si was measured. We found intense and well collimated monochromatic photons, i.e. self-diffracted X rays (SDX), emitted to the "Bragg angle". The intensity of SDX was much greater than the parametric X rays from a Si plate of equivalent thickness. For 35.5 keV X rays with 100 layered Si target, absolute brightness of SDX was comparable to the synchrotron radiation from a 1.7 GeV storage ring.
| Original language | English |
|---|---|
| Pages (from-to) | 25-30 |
| Number of pages | 6 |
| Journal | Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms |
| Volume | 145 |
| Issue number | 1-2 |
| DOIs | |
| Publication status | Published - 2 Oct 1998 |
ASJC Scopus subject areas
- Nuclear and High Energy Physics
- Instrumentation
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Takashima, Y., Aramitsu, K., Endo, I., Fukumi, A., Goto, K., Horiguchi, T., Isshiki, T., Kaplin, V., Kobayashi, T., Kondo, T., Matsukado, K., Muto, M., Nakayama, K., Nitta, H., Okazaki, Y., Potylitsin, A., Takahashi, T., & Yoshida, K. (1998). Observation of monochromatic and tunable hard X radiation from stratified Si single crystals. Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, 145(1-2), 25-30. https://doi.org/10.1016/S0168-583X(98)00225-0