Abstract
X radiation by 900 MeV electrons in accurately aligned 1-100 layers of 16 μm thick monocrystalline foils of Si was measured. We found intense and well collimated monochromatic photons, i.e. self-diffracted X rays (SDX), emitted to the "Bragg angle". The intensity of SDX was much greater than the parametric X rays from a Si plate of equivalent thickness. For 35.5 keV X rays with 100 layered Si target, absolute brightness of SDX was comparable to the synchrotron radiation from a 1.7 GeV storage ring.
| Original language | English |
|---|---|
| Pages (from-to) | 25-30 |
| Number of pages | 6 |
| Journal | Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms |
| Volume | 145 |
| Issue number | 1-2 |
| DOIs | |
| Publication status | Published - 2 Oct 1998 |
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ASJC Scopus subject areas
- Nuclear and High Energy Physics
- Instrumentation
Cite this
Observation of monochromatic and tunable hard X radiation from stratified Si single crystals. / Takashima, Y.; Aramitsu, K.; Endo, I.; Fukumi, A.; Goto, K.; Horiguchi, T.; Isshiki, T.; Kaplin, V.; Kobayashi, T.; Kondo, T.; Matsukado, K.; Muto, M.; Nakayama, K.; Nitta, H.; Okazaki, Y.; Potylitsin, A.; Takahashi, T.; Yoshida, K.
In: Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, Vol. 145, No. 1-2, 02.10.1998, p. 25-30.Research output: Contribution to journal › Article
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TY - JOUR
T1 - Observation of monochromatic and tunable hard X radiation from stratified Si single crystals
AU - Takashima, Y.
AU - Aramitsu, K.
AU - Endo, I.
AU - Fukumi, A.
AU - Goto, K.
AU - Horiguchi, T.
AU - Isshiki, T.
AU - Kaplin, V.
AU - Kobayashi, T.
AU - Kondo, T.
AU - Matsukado, K.
AU - Muto, M.
AU - Nakayama, K.
AU - Nitta, H.
AU - Okazaki, Y.
AU - Potylitsin, A.
AU - Takahashi, T.
AU - Yoshida, K.
PY - 1998/10/2
Y1 - 1998/10/2
N2 - X radiation by 900 MeV electrons in accurately aligned 1-100 layers of 16 μm thick monocrystalline foils of Si was measured. We found intense and well collimated monochromatic photons, i.e. self-diffracted X rays (SDX), emitted to the "Bragg angle". The intensity of SDX was much greater than the parametric X rays from a Si plate of equivalent thickness. For 35.5 keV X rays with 100 layered Si target, absolute brightness of SDX was comparable to the synchrotron radiation from a 1.7 GeV storage ring.
AB - X radiation by 900 MeV electrons in accurately aligned 1-100 layers of 16 μm thick monocrystalline foils of Si was measured. We found intense and well collimated monochromatic photons, i.e. self-diffracted X rays (SDX), emitted to the "Bragg angle". The intensity of SDX was much greater than the parametric X rays from a Si plate of equivalent thickness. For 35.5 keV X rays with 100 layered Si target, absolute brightness of SDX was comparable to the synchrotron radiation from a 1.7 GeV storage ring.
UR - http://www.scopus.com/inward/record.url?scp=0032475601&partnerID=8YFLogxK
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U2 - 10.1016/S0168-583X(98)00225-0
DO - 10.1016/S0168-583X(98)00225-0
M3 - Article
AN - SCOPUS:0032475601
VL - 145
SP - 25
EP - 30
JO - Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
JF - Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
SN - 0168-583X
IS - 1-2
ER -