Abstract
We have observed the emission of 15 keV x rays produced by 500 MeV electrons passing through a x-ray multilayer mirror. The mirror consisted of 300 pairs of W and B4C layers with layer spacing of 12.36 Å and supported by a 100 μm Si substrate. The x rays were emitted at the Bragg angle θγ = 33.15 mrad with respect to the mirror surface and at the angle γD = 66.3 mrad with respect to the electron-beam direction. The spatial distribution and the spectral angular dependence of the x rays were measured and shown to be larger than the parametric x rays emitted from the Si substrate. The value of the differential photon efficiency was estimated to be about 0.22 photons/electron/str.
| Original language | English |
|---|---|
| Pages (from-to) | 3647-3649 |
| Number of pages | 3 |
| Journal | Applied Physics Letters |
| Volume | 76 |
| Issue number | 24 |
| Publication status | Published - 12 Jun 2000 |
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ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)
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Observation of bright monochromatic x rays generated by relativistic electrons passing through a multilayer mirror. / Kaplin, V. V.; Uglov, S. R.; Zabaev, V. N.; Piestrup, M. A.; Gary, C. K.; Nasonov, N. N.; Fuller, M. K.
In: Applied Physics Letters, Vol. 76, No. 24, 12.06.2000, p. 3647-3649.Research output: Contribution to journal › Article
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TY - JOUR
T1 - Observation of bright monochromatic x rays generated by relativistic electrons passing through a multilayer mirror
AU - Kaplin, V. V.
AU - Uglov, S. R.
AU - Zabaev, V. N.
AU - Piestrup, M. A.
AU - Gary, C. K.
AU - Nasonov, N. N.
AU - Fuller, M. K.
PY - 2000/6/12
Y1 - 2000/6/12
N2 - We have observed the emission of 15 keV x rays produced by 500 MeV electrons passing through a x-ray multilayer mirror. The mirror consisted of 300 pairs of W and B4C layers with layer spacing of 12.36 Å and supported by a 100 μm Si substrate. The x rays were emitted at the Bragg angle θγ = 33.15 mrad with respect to the mirror surface and at the angle γD = 66.3 mrad with respect to the electron-beam direction. The spatial distribution and the spectral angular dependence of the x rays were measured and shown to be larger than the parametric x rays emitted from the Si substrate. The value of the differential photon efficiency was estimated to be about 0.22 photons/electron/str.
AB - We have observed the emission of 15 keV x rays produced by 500 MeV electrons passing through a x-ray multilayer mirror. The mirror consisted of 300 pairs of W and B4C layers with layer spacing of 12.36 Å and supported by a 100 μm Si substrate. The x rays were emitted at the Bragg angle θγ = 33.15 mrad with respect to the mirror surface and at the angle γD = 66.3 mrad with respect to the electron-beam direction. The spatial distribution and the spectral angular dependence of the x rays were measured and shown to be larger than the parametric x rays emitted from the Si substrate. The value of the differential photon efficiency was estimated to be about 0.22 photons/electron/str.
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M3 - Article
VL - 76
SP - 3647
EP - 3649
JO - Applied Physics Letters
JF - Applied Physics Letters
SN - 0003-6951
IS - 24
ER -