Abstract
We have observed the emission of 15 keV x rays produced by 500 MeV electrons passing through a x-ray multilayer mirror. The mirror consisted of 300 pairs of W and B4C layers with layer spacing of 12.36 Å and supported by a 100 μm Si substrate. The x rays were emitted at the Bragg angle θγ = 33.15 mrad with respect to the mirror surface and at the angle γD = 66.3 mrad with respect to the electron-beam direction. The spatial distribution and the spectral angular dependence of the x rays were measured and shown to be larger than the parametric x rays emitted from the Si substrate. The value of the differential photon efficiency was estimated to be about 0.22 photons/electron/str.
| Original language | English |
|---|---|
| Pages (from-to) | 3647-3649 |
| Number of pages | 3 |
| Journal | Applied Physics Letters |
| Volume | 76 |
| Issue number | 24 |
| Publication status | Published - 12 Jun 2000 |
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ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)
Cite this
Kaplin, V. V., Uglov, S. R., Zabaev, V. N., Piestrup, M. A., Gary, C. K., Nasonov, N. N., & Fuller, M. K. (2000). Observation of bright monochromatic x rays generated by relativistic electrons passing through a multilayer mirror. Applied Physics Letters, 76(24), 3647-3649.