Numerical Simulation of the High-Voltage Switch Operating in a Self-Breakdown Mode

Vasily Yu Kozhevnikov, Andrey A. Zherlitsyn, Andrey V. Kozyrev, Vladislav S. Igumnov, Evgeniy V. Kumpyak, Aleksandr O. Kokovin

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

In this article we construct the model of a highvoltage switch. The proposed model is based on the drift-diffusion approximation and it is constructed according to the principles of a two-moment discharge plasma model. Using this model, it is possible calculating the time-dependent characteristics of the switching process with high accuracy both in a simplified one-dimensional formulation as well as in the realistic two-dimensional axisymmetric configuration. The obtained numerical results perfectly fit with the experimental data of switching process and the triggering stability.

Original languageEnglish
Title of host publication2018 26th Telecommunications Forum, TELFOR 2018 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781538671702
DOIs
Publication statusPublished - 14 Jan 2019
Event26th Telecommunications Forum, TELFOR 2018 - Belgrade, Serbia
Duration: 20 Nov 201821 Nov 2018

Publication series

Name2018 26th Telecommunications Forum, TELFOR 2018 - Proceedings

Conference

Conference26th Telecommunications Forum, TELFOR 2018
CountrySerbia
CityBelgrade
Period20.11.1821.11.18

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Keywords

  • Capacitive energy storages
  • High-current generators
  • High-voltage switches

ASJC Scopus subject areas

  • Computer Networks and Communications
  • Signal Processing
  • Safety, Risk, Reliability and Quality

Cite this

Kozhevnikov, V. Y., Zherlitsyn, A. A., Kozyrev, A. V., Igumnov, V. S., Kumpyak, E. V., & Kokovin, A. O. (2019). Numerical Simulation of the High-Voltage Switch Operating in a Self-Breakdown Mode. In 2018 26th Telecommunications Forum, TELFOR 2018 - Proceedings [8612167] (2018 26th Telecommunications Forum, TELFOR 2018 - Proceedings). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/TELFOR.2018.8612167