Abstract
The changes in surface topography of thin conducting Ag films under high-density current condition are studied by optical and scanning tunnelling microscopy (STM). It is established that the loss of conductivity in specimens occurs through depletion of the material due to their overheating and electromigration process. It is shown that the r.m.s. roughness, the fractal dimension of voids and the fractal dimension of the surface allow complete numerical characterization of surface topography changes in thin Ag films.
| Original language | English |
|---|---|
| Pages (from-to) | 249-255 |
| Number of pages | 7 |
| Journal | Acta Metallurgica Sinica (English Letters) |
| Volume | 16 |
| Issue number | 4 |
| Publication status | Published - Aug 2003 |
Keywords
- Fractal dimension
- STM
- Surface roughness
- Thin Ag films
ASJC Scopus subject areas
- Metals and Alloys
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Panin, A. V., Chun, H. G., Shugurov, A. R., Panin, S. V., & Pykhtin, N. V. (2003). Numerical characterization of current-induced changes in surface morphology of thin Ag films. Acta Metallurgica Sinica (English Letters), 16(4), 249-255.