Numerical characterization of current-induced changes in surface morphology of thin Ag films

Alexey Victorovich Panin, H. G. Chun, A. R. Shugurov, S. V. Panin, N. V. Pykhtin

Research output: Contribution to journalArticle

Abstract

The changes in surface topography of thin conducting Ag films under high-density current condition are studied by optical and scanning tunnelling microscopy (STM). It is established that the loss of conductivity in specimens occurs through depletion of the material due to their overheating and electromigration process. It is shown that the r.m.s. roughness, the fractal dimension of voids and the fractal dimension of the surface allow complete numerical characterization of surface topography changes in thin Ag films.

Original languageEnglish
Pages (from-to)249-255
Number of pages7
JournalActa Metallurgica Sinica (English Letters)
Volume16
Issue number4
Publication statusPublished - Aug 2003

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Induced currents
Surface topography
Fractal dimension
Surface morphology
Electromigration
Scanning tunneling microscopy
Current density
Surface roughness

Keywords

  • Fractal dimension
  • STM
  • Surface roughness
  • Thin Ag films

ASJC Scopus subject areas

  • Metals and Alloys

Cite this

Numerical characterization of current-induced changes in surface morphology of thin Ag films. / Panin, Alexey Victorovich; Chun, H. G.; Shugurov, A. R.; Panin, S. V.; Pykhtin, N. V.

In: Acta Metallurgica Sinica (English Letters), Vol. 16, No. 4, 08.2003, p. 249-255.

Research output: Contribution to journalArticle

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