Numerical characterization of current-induced changes in surface morphology of thin Ag films

Abstract

The changes in surface topography of thin conducting Ag films under high-density current condition are studied by optical and scanning tunnelling microscopy (STM). It is established that the loss of conductivity in specimens occurs through depletion of the material due to their overheating and electromigration process. It is shown that the r.m.s. roughness, the fractal dimension of voids and the fractal dimension of the surface allow complete numerical characterization of surface topography changes in thin Ag films.

Original language	English
Pages (from-to)	249-255
Number of pages	7
Journal	Acta Metallurgica Sinica (English Letters)
Volume	16
Issue number	4
Publication status	Published - Aug 2003

Keywords

Fractal dimension
STM
Surface roughness
Thin Ag films

ASJC Scopus subject areas

Metals and Alloys

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title = "Numerical characterization of current-induced changes in surface morphology of thin Ag films",

abstract = "The changes in surface topography of thin conducting Ag films under high-density current condition are studied by optical and scanning tunnelling microscopy (STM). It is established that the loss of conductivity in specimens occurs through depletion of the material due to their overheating and electromigration process. It is shown that the r.m.s. roughness, the fractal dimension of voids and the fractal dimension of the surface allow complete numerical characterization of surface topography changes in thin Ag films.",

keywords = "Fractal dimension, STM, Surface roughness, Thin Ag films",

author = "Panin, {Alexey Victorovich} and Chun, {H. G.} and Shugurov, {A. R.} and Panin, {S. V.} and Pykhtin, {N. V.}",

year = "2003",

month = aug,

language = "English",

volume = "16",

pages = "249--255",

journal = "Acta Metallurgica Sinica (English Letters)",

issn = "1006-7191",

publisher = "Chinese Society for Metals",

number = "4",

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TY - JOUR

T1 - Numerical characterization of current-induced changes in surface morphology of thin Ag films

AU - Panin, Alexey Victorovich

AU - Chun, H. G.

AU - Shugurov, A. R.

AU - Panin, S. V.

AU - Pykhtin, N. V.

PY - 2003/8

Y1 - 2003/8

N2 - The changes in surface topography of thin conducting Ag films under high-density current condition are studied by optical and scanning tunnelling microscopy (STM). It is established that the loss of conductivity in specimens occurs through depletion of the material due to their overheating and electromigration process. It is shown that the r.m.s. roughness, the fractal dimension of voids and the fractal dimension of the surface allow complete numerical characterization of surface topography changes in thin Ag films.

AB - The changes in surface topography of thin conducting Ag films under high-density current condition are studied by optical and scanning tunnelling microscopy (STM). It is established that the loss of conductivity in specimens occurs through depletion of the material due to their overheating and electromigration process. It is shown that the r.m.s. roughness, the fractal dimension of voids and the fractal dimension of the surface allow complete numerical characterization of surface topography changes in thin Ag films.

KW - Fractal dimension

KW - STM

KW - Surface roughness

KW - Thin Ag films

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VL - 16

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EP - 255

JO - Acta Metallurgica Sinica (English Letters)

JF - Acta Metallurgica Sinica (English Letters)

SN - 1006-7191

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