Non-destructive testing of honeycomb CFRP panel by means of shearography

Mikhail Burkov, Pavel Lyubutin, Anton Byakov

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The results of application of developed shearography setup for detection of barely visible impact damage (BVID) in honeycomb carbon fiber reinforced polymer (CFRP) panel are presented. The specimen was impacted using drop weight technique with a step of 1 J; totally there were 5 impact tests. Shearography was applied using thermal loading: IR heating or cooling of the CFRP specimen. Four DPSS lasers with a wavelength of 532 nm were used as sources of coherent illumination. The shearograms obtained after the testing allowed revealing BVIDs as non-uniformities in the strain fields. The results were analyzed in terms of sensitivity of digital shearography to impact damages of various size and severity.

Original languageEnglish
Title of host publicationProceedings of the Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures
EditorsVasily M. Fomin, Victor E. Panin, Sergey G. Psakhie
PublisherAmerican Institute of Physics Inc.
Volume2051
ISBN (Electronic)9780735417779
DOIs
Publication statusPublished - 12 Dec 2018
EventInternational Symposium on Hierarchical Materials: Development and Applications for New Technologies and Reliable Structures 2018 - Tomsk, Russian Federation
Duration: 1 Oct 20185 Oct 2018

Conference

ConferenceInternational Symposium on Hierarchical Materials: Development and Applications for New Technologies and Reliable Structures 2018
CountryRussian Federation
CityTomsk
Period1.10.185.10.18

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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    Burkov, M., Lyubutin, P., & Byakov, A. (2018). Non-destructive testing of honeycomb CFRP panel by means of shearography. In V. M. Fomin, V. E. Panin, & S. G. Psakhie (Eds.), Proceedings of the Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures (Vol. 2051). [020044] American Institute of Physics Inc.. https://doi.org/10.1063/1.5083287