Network vulnerability in two-phase evolution

N. A. Kinash, A. I. Trufanov, A. A. Tikhomirov, O. G. Berestneva, O. N. Fisochenko

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

Contrary to traditional evolutionary models of complex networks a novel consideration with two-formation & degradation - phases has been proposed. To clarify which of the stages of the phases are more sensible the evolving network has been put to simulated attacks. A novel integral vulnerability metrics has been proposed which demonstrated strong dependence on the network growth rate of the stage put under short time attacks. It was found that the higher the rate is the higher pertinent vulnerability is observed. The study gives a dynamic scope for future analysis of network security, hints to build resilient network systems, and ways to perform network management effectively.

Original languageEnglish
Title of host publication2016 International Siberian Conference on Control and Communications, SIBCON 2016 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781467383837
DOIs
Publication statusPublished - 14 Jun 2016
Event2016 International Siberian Conference on Control and Communications, SIBCON 2016 - Moscow, Russian Federation
Duration: 12 May 201614 May 2016

Other

Other2016 International Siberian Conference on Control and Communications, SIBCON 2016
CountryRussian Federation
CityMoscow
Period12.5.1614.5.16

    Fingerprint

Keywords

  • dynamic complex networks
  • vulnerability metrics

ASJC Scopus subject areas

  • Signal Processing
  • Control and Systems Engineering
  • Electrical and Electronic Engineering
  • Modelling and Simulation
  • Computer Networks and Communications

Cite this

Kinash, N. A., Trufanov, A. I., Tikhomirov, A. A., Berestneva, O. G., & Fisochenko, O. N. (2016). Network vulnerability in two-phase evolution. In 2016 International Siberian Conference on Control and Communications, SIBCON 2016 - Proceedings [7491785] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/SIBCON.2016.7491785