Negative resistance and local charge-density-wave dynamics

H. S J Van Der Zant, E. Slot, S. V. Zaitsev-Zotov, S. N. Artemenko

Research Laboratory for Super High Frequency Technology

Research output: Contribution to journal › Article

Abstract

Current-voltage (IV) characteristics were recorded on high-quality NbSe₃ and TaS₃ crystals with probe spacings on the submicron range. The results show that the micron scale is the typical length scale for the charge-density-wave (CDW) dynamics.

Original language	English
Article number	126401
Journal	Physical Review Letters
Volume	87
Issue number	12
Publication status	Published - 17 Sep 2001

ASJC Scopus subject areas

Physics and Astronomy(all)

Access to Document

Fingerprint Dive into the research topics of 'Negative resistance and local charge-density-wave dynamics'. Together they form a unique fingerprint.

Cite this

Van Der Zant, H. S. J., Slot, E., Zaitsev-Zotov, S. V., & Artemenko, S. N. (2001). Negative resistance and local charge-density-wave dynamics. Physical Review Letters, 87(12), [126401].

@article{6fce4aec6a604b938455a83e9f8b7236,

title = "Negative resistance and local charge-density-wave dynamics",

abstract = "Current-voltage (IV) characteristics were recorded on high-quality NbSe3 and TaS3 crystals with probe spacings on the submicron range. The results show that the micron scale is the typical length scale for the charge-density-wave (CDW) dynamics.",

author = "{Van Der Zant}, {H. S J} and E. Slot and Zaitsev-Zotov, {S. V.} and Artemenko, {S. N.}",

year = "2001",

month = sep,

day = "17",

language = "English",

volume = "87",

journal = "Physical Review Letters",

issn = "0031-9007",

publisher = "American Physical Society",

number = "12",

}

TY - JOUR

T1 - Negative resistance and local charge-density-wave dynamics

AU - Van Der Zant, H. S J

AU - Slot, E.

AU - Zaitsev-Zotov, S. V.

AU - Artemenko, S. N.

PY - 2001/9/17

Y1 - 2001/9/17

N2 - Current-voltage (IV) characteristics were recorded on high-quality NbSe3 and TaS3 crystals with probe spacings on the submicron range. The results show that the micron scale is the typical length scale for the charge-density-wave (CDW) dynamics.

AB - Current-voltage (IV) characteristics were recorded on high-quality NbSe3 and TaS3 crystals with probe spacings on the submicron range. The results show that the micron scale is the typical length scale for the charge-density-wave (CDW) dynamics.

UR - http://www.scopus.com/inward/record.url?scp=39249083009&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=39249083009&partnerID=8YFLogxK

M3 - Article

AN - SCOPUS:39249083009

VL - 87

JO - Physical Review Letters

JF - Physical Review Letters

SN - 0031-9007

IS - 12

M1 - 126401

ER -