Abstract
Current-voltage (IV) characteristics were recorded on high-quality NbSe3 and TaS3 crystals with probe spacings on the submicron range. The results show that the micron scale is the typical length scale for the charge-density-wave (CDW) dynamics.
| Original language | English |
|---|---|
| Article number | 126401 |
| Journal | Physical Review Letters |
| Volume | 87 |
| Issue number | 12 |
| Publication status | Published - 17 Sep 2001 |
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ASJC Scopus subject areas
- Physics and Astronomy(all)
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Negative resistance and local charge-density-wave dynamics. / Van Der Zant, H. S J; Slot, E.; Zaitsev-Zotov, S. V.; Artemenko, S. N.
In: Physical Review Letters, Vol. 87, No. 12, 126401, 17.09.2001.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Negative resistance and local charge-density-wave dynamics
AU - Van Der Zant, H. S J
AU - Slot, E.
AU - Zaitsev-Zotov, S. V.
AU - Artemenko, S. N.
PY - 2001/9/17
Y1 - 2001/9/17
N2 - Current-voltage (IV) characteristics were recorded on high-quality NbSe3 and TaS3 crystals with probe spacings on the submicron range. The results show that the micron scale is the typical length scale for the charge-density-wave (CDW) dynamics.
AB - Current-voltage (IV) characteristics were recorded on high-quality NbSe3 and TaS3 crystals with probe spacings on the submicron range. The results show that the micron scale is the typical length scale for the charge-density-wave (CDW) dynamics.
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M3 - Article
AN - SCOPUS:39249083009
VL - 87
JO - Physical Review Letters
JF - Physical Review Letters
SN - 0031-9007
IS - 12
M1 - 126401
ER -