Abstract
Current-voltage (IV) characteristics were recorded on high-quality NbSe3 and TaS3 crystals with probe spacings on the submicron range. The results show that the micron scale is the typical length scale for the charge-density-wave (CDW) dynamics.
| Original language | English |
|---|---|
| Article number | 126401 |
| Journal | Physical Review Letters |
| Volume | 87 |
| Issue number | 12 |
| Publication status | Published - 17 Sep 2001 |
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ASJC Scopus subject areas
- Physics and Astronomy(all)
Cite this
Van Der Zant, H. S. J., Slot, E., Zaitsev-Zotov, S. V., & Artemenko, S. N. (2001). Negative resistance and local charge-density-wave dynamics. Physical Review Letters, 87(12), [126401].