Negative resistance and local charge-density-wave dynamics

H. S J Van Der Zant, E. Slot, S. V. Zaitsev-Zotov, S. N. Artemenko

Research Laboratory for Super High Frequency Technology

Research output: Contribution to journal › Article › peer-review

Abstract

Current-voltage (IV) characteristics were recorded on high-quality NbSe₃ and TaS₃ crystals with probe spacings on the submicron range. The results show that the micron scale is the typical length scale for the charge-density-wave (CDW) dynamics.

Original language	English
Article number	126401
Journal	Physical Review Letters
Volume	87
Issue number	12
Publication status	Published - 17 Sep 2001

ASJC Scopus subject areas

Physics and Astronomy(all)

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title = "Negative resistance and local charge-density-wave dynamics",

abstract = "Current-voltage (IV) characteristics were recorded on high-quality NbSe3 and TaS3 crystals with probe spacings on the submicron range. The results show that the micron scale is the typical length scale for the charge-density-wave (CDW) dynamics.",

author = "{Van Der Zant}, {H. S J} and E. Slot and Zaitsev-Zotov, {S. V.} and Artemenko, {S. N.}",

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AU - Slot, E.

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AU - Artemenko, S. N.

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AB - Current-voltage (IV) characteristics were recorded on high-quality NbSe3 and TaS3 crystals with probe spacings on the submicron range. The results show that the micron scale is the typical length scale for the charge-density-wave (CDW) dynamics.

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