Negative resistance and local charge-density-wave dynamics

H. S J Van Der Zant, E. Slot, S. V. Zaitsev-Zotov, S. N. Artemenko

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Current-voltage (IV) characteristics were recorded on high-quality NbSe3 and TaS3 crystals with probe spacings on the submicron range. The results show that the micron scale is the typical length scale for the charge-density-wave (CDW) dynamics.

Original languageEnglish
Article number126401
JournalPhysical Review Letters
Issue number12
Publication statusPublished - 17 Sep 2001


ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

Van Der Zant, H. S. J., Slot, E., Zaitsev-Zotov, S. V., & Artemenko, S. N. (2001). Negative resistance and local charge-density-wave dynamics. Physical Review Letters, 87(12), [126401].