Abstract
Current-voltage (IV) characteristics were recorded on high-quality NbSe3 and TaS3 crystals with probe spacings on the submicron range. The results show that the micron scale is the typical length scale for the charge-density-wave (CDW) dynamics.
Original language | English |
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Article number | 126401 |
Journal | Physical Review Letters |
Volume | 87 |
Issue number | 12 |
Publication status | Published - 17 Sep 2001 |
ASJC Scopus subject areas
- Physics and Astronomy(all)