Natural language processing in systems with computer-aided knowledge testing

Division for Information Technology

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

In the sphere of distant learning computer-aided knowledge testing (CAKT) is widely used. The state of affairs in the field of CAKT systems is analyzed in the report. It is shown that widespread "elective" tests have a number of essential disadvantages. The authors offer the approach permitting to use natural language processing as one of the major CAKT components. The main idea of the approach consists in high-tech matching a student's answer with the answer template given by the instructor. In addition, text information obtained from electronic textbooks and books on the course and transformed into a semantic network can be used when evaluating. Necessary methods and algorithms were designed. The authors also offered software implementing the methods developed. This software as a subsystem can be built into the electronic textbooks, electronic courses and other CAKT systems. The results obtained allow to believe in the appropriateness of the approach for actual usage.

Original language	English
Title of host publication	Proceedings of the 7th International Scientific and Practical Conference of Students, Post-Graduates and Young Scientists: Modern Techniques and Technology, MTT 2001
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	181-185
Number of pages	5
ISBN (Electronic)	0780363469, 9780780363465
DOIs	https://doi.org/10.1109/MTT.2001.983793
Publication status	Published - 2001
Event	7th International Scientific and Practical Conference of Students, Post-Graduates and Young Scientists on Modern Techniques and Technology, MTT 2001 - Tomsk, Russian Federation Duration: 26 Feb 2001 → 2 Mar 2001

Conference

Conference	7th International Scientific and Practical Conference of Students, Post-Graduates and Young Scientists on Modern Techniques and Technology, MTT 2001
Country	Russian Federation
City	Tomsk
Period	26.2.01 → 2.3.01

Fingerprint

Keywords

computer-aided knowledge testing
distant learning
natural language processing

ASJC Scopus subject areas

Biotechnology
Computer Science Applications
Civil and Structural Engineering
Mechanical Engineering
Materials Science (miscellaneous)
Instrumentation
Education

Cite this

Miroshnichenko, E. A., & Korshunov, P. F. (2001). Natural language processing in systems with computer-aided knowledge testing. In Proceedings of the 7th International Scientific and Practical Conference of Students, Post-Graduates and Young Scientists: Modern Techniques and Technology, MTT 2001 (pp. 181-185). [983793] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/MTT.2001.983793

Natural language processing in systems with computer-aided knowledge testing. / Miroshnichenko, E. A.; Korshunov, P. F.

Proceedings of the 7th International Scientific and Practical Conference of Students, Post-Graduates and Young Scientists: Modern Techniques and Technology, MTT 2001. Institute of Electrical and Electronics Engineers Inc., 2001. p. 181-185 983793.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Miroshnichenko, EA & Korshunov, PF 2001, Natural language processing in systems with computer-aided knowledge testing. in Proceedings of the 7th International Scientific and Practical Conference of Students, Post-Graduates and Young Scientists: Modern Techniques and Technology, MTT 2001., 983793, Institute of Electrical and Electronics Engineers Inc., pp. 181-185, 7th International Scientific and Practical Conference of Students, Post-Graduates and Young Scientists on Modern Techniques and Technology, MTT 2001, Tomsk, Russian Federation, 26.2.01. https://doi.org/10.1109/MTT.2001.983793

Miroshnichenko EA, Korshunov PF. Natural language processing in systems with computer-aided knowledge testing. In Proceedings of the 7th International Scientific and Practical Conference of Students, Post-Graduates and Young Scientists: Modern Techniques and Technology, MTT 2001. Institute of Electrical and Electronics Engineers Inc. 2001. p. 181-185. 983793 https://doi.org/10.1109/MTT.2001.983793

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Access to Document

10.1109/MTT.2001.983793