Nanoscale optical and electrical characterization of horizontally aligned single-walled carbon nanotubes

Raul D. Rodriguez, Marius Toader, Sascha Hermann, Evgeniya Sheremet, Susanne Müller, Ovidiu D. Gordan, Haibo Yu, Stefan E. Schulz, Michael Hietschold, Dietrich R.T. Zahn

Research output: Contribution to journalArticle

7 Citations (Scopus)

Abstract

During the recent years, a significant amount of research has been performed on single-walled carbon nanotubes (SWCNTs) as a channel material in thin-film transistors (Pham et al. IEEE Trans Nanotechnol 11:44-50, 2012). This has prompted the application of advanced characterization techniques based on combined atomic force microscopy (AFM) and Raman spectroscopy studies (Mureau et al. Electrophoresis 29:2266-2271, 2008). In this context, we use confocal Raman microscopy and current sensing atomic force microscopy (CS-AFM) to study phonons and the electronic transport in semiconducting SWCNTs, which were aligned between palladium electrodes using dielectrophoresis (Kuzyk Electrophoresis 32:2307-2313, 2011). Raman imaging was performed in the region around the electrodes on the suspended CNTs using several laser excitation wavelengths. Analysis of the G+/G- splitting in the Raman spectra (Sgobba and Guldi Chem Soc Rev 38:165-184, 2009) shows CNT diameters of 2.5 ± 0.3 nm. Neither surface modification nor increase in defect density or stress at the CNT-electrode contact could be detected, but rather a shift in G+ and G- peak positions in regions with high CNT density between the electrodes. Simultaneous topographical and electrical characterization of the CNT transistor by CS-AFM confirms the presence of CNT bundles having a stable electrical contact with the transistor electrodes. For a similar load force, reproducible current-voltage (I/V) curves for the same CNT regions verify the stability of the electrical contact between the nanotube and the electrodes as well as the nanotube and the AFM tip over different experimental sessions using different AFM tips. Strong variations observed in the I/V response at different regions of the CNT transistor are discussed.

Original languageEnglish
Pages (from-to)1-6
Number of pages6
JournalNanoscale Research Letters
Volume7
Issue number1
DOIs
Publication statusPublished - 1 Dec 2012
Externally publishedYes

Fingerprint

Single-walled carbon nanotubes (SWCN)
carbon nanotubes
Atomic force microscopy
Electrodes
Electrophoresis
Transistors
atomic force microscopy
electrodes
transistors
Nanotubes
electrophoresis
Laser excitation
Defect density
Palladium
Thin film transistors
Phonons
electric contacts
nanotubes
Surface treatment
Raman spectroscopy

Keywords

  • Atomic force microscopy
  • CNT transistor
  • Current sensing AFM
  • Raman imaging
  • Single-walled carbon nanotubes

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics

Cite this

Nanoscale optical and electrical characterization of horizontally aligned single-walled carbon nanotubes. / Rodriguez, Raul D.; Toader, Marius; Hermann, Sascha; Sheremet, Evgeniya; Müller, Susanne; Gordan, Ovidiu D.; Yu, Haibo; Schulz, Stefan E.; Hietschold, Michael; Zahn, Dietrich R.T.

In: Nanoscale Research Letters, Vol. 7, No. 1, 01.12.2012, p. 1-6.

Research output: Contribution to journalArticle

Rodriguez, RD, Toader, M, Hermann, S, Sheremet, E, Müller, S, Gordan, OD, Yu, H, Schulz, SE, Hietschold, M & Zahn, DRT 2012, 'Nanoscale optical and electrical characterization of horizontally aligned single-walled carbon nanotubes', Nanoscale Research Letters, vol. 7, no. 1, pp. 1-6. https://doi.org/10.1186/1556-276X-7-682
Rodriguez, Raul D. ; Toader, Marius ; Hermann, Sascha ; Sheremet, Evgeniya ; Müller, Susanne ; Gordan, Ovidiu D. ; Yu, Haibo ; Schulz, Stefan E. ; Hietschold, Michael ; Zahn, Dietrich R.T. / Nanoscale optical and electrical characterization of horizontally aligned single-walled carbon nanotubes. In: Nanoscale Research Letters. 2012 ; Vol. 7, No. 1. pp. 1-6.
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