Modification of the surface layers of copper by a diffuse discharge in atmospheric pressure air

Mikhail A. Shulepov, Mikhail V. Erofeev, Konstantin V. Oskomov, Victor Fedotovich Tarasenko

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The paper presents the results of examination of copper samples exposed to a diffuse discharge initiated by a runaway electron beam in air under normal pressure. The changes in the chemical composition of the surface layers of copper caused by the action of the discharge were investigated. It has been found that the oxygen and carbon concentrations in the surface layers depend on the number of discharge pulses. The study was aimed at finding possible ways of using this type of discharge in research and industry.

Original languageEnglish
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
PublisherSPIE
Volume9810
ISBN (Print)9781510600515
DOIs
Publication statusPublished - 2015
EventInternational Conference on Atomic and Molecular Pulsed Lasers XII - Tomsk, Russian Federation
Duration: 13 Sep 201518 Sep 2015

Other

OtherInternational Conference on Atomic and Molecular Pulsed Lasers XII
CountryRussian Federation
CityTomsk
Period13.9.1518.9.15

Keywords

  • copper
  • REP DD
  • Runaway electrons preionized diffuse discharges
  • surface modification

ASJC Scopus subject areas

  • Applied Mathematics
  • Computer Science Applications
  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Fingerprint Dive into the research topics of 'Modification of the surface layers of copper by a diffuse discharge in atmospheric pressure air'. Together they form a unique fingerprint.

  • Cite this

    Shulepov, M. A., Erofeev, M. V., Oskomov, K. V., & Tarasenko, V. F. (2015). Modification of the surface layers of copper by a diffuse discharge in atmospheric pressure air. In Proceedings of SPIE - The International Society for Optical Engineering (Vol. 9810). [98100Y] SPIE. https://doi.org/10.1117/12.2224926