Modification of diode x-rays by electron multiple backscatter from anode

V. V. Ryzhov, V. I. Bespalov, A. V. Kirikov, I. Yu Turchanovsky, V. P. Tarakanov

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

In high-power vacuum diodes with high-atomic-number anodes, a large fraction of the electrons are backscattered, thus changing all diode characteristics: the electron and ion currents [1,2], the electron beam spectrum [3], and, finally, the X-ray spectrum and the X-ray efficiency. The latter problem is very important for intense electron beam radiography. Based on the KARAT [4] and Monte Carlo [5] codes, a hybrid PIC/Monte Carlo code is now being.. developed to examine the above problems. The results of computer simulations are compared with experimental data.

Original language	English
Title of host publication	PPPS 2001 - Pulsed Power Plasma Science 2001
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	1336-1339
Number of pages	4
Volume	2
ISBN (Print)	0780371208, 9780780371200
DOIs	https://doi.org/10.1109/PPPS.2001.1001797
Publication status	Published - 2001
Event	28th IEEE International Conference on Plasma Science and 13th IEEE International Pulsed Power Conference, PPPS 2001 - Las Vegas, United States Duration: 17 Jun 2001 → 22 Jun 2001

Other

Other	28th IEEE International Conference on Plasma Science and 13th IEEE International Pulsed Power Conference, PPPS 2001
Country	United States
City	Las Vegas
Period	17.6.01 → 22.6.01

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ASJC Scopus subject areas

Energy Engineering and Power Technology
Nuclear Energy and Engineering
Nuclear and High Energy Physics

Cite this

Ryzhov, V. V., Bespalov, V. I., Kirikov, A. V., Turchanovsky, I. Y., & Tarakanov, V. P. (2001). Modification of diode x-rays by electron multiple backscatter from anode. In PPPS 2001 - Pulsed Power Plasma Science 2001 (Vol. 2, pp. 1336-1339). [1001797] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/PPPS.2001.1001797

Modification of diode x-rays by electron multiple backscatter from anode. / Ryzhov, V. V.; Bespalov, V. I.; Kirikov, A. V.; Turchanovsky, I. Yu; Tarakanov, V. P.

PPPS 2001 - Pulsed Power Plasma Science 2001. Vol. 2 Institute of Electrical and Electronics Engineers Inc., 2001. p. 1336-1339 1001797.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Ryzhov, VV , Bespalov, VI, Kirikov, AV, Turchanovsky, IY & Tarakanov, VP 2001, Modification of diode x-rays by electron multiple backscatter from anode. in PPPS 2001 - Pulsed Power Plasma Science 2001. vol. 2, 1001797, Institute of Electrical and Electronics Engineers Inc., pp. 1336-1339, 28th IEEE International Conference on Plasma Science and 13th IEEE International Pulsed Power Conference, PPPS 2001, Las Vegas, United States, 17.6.01. https://doi.org/10.1109/PPPS.2001.1001797

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AB - In high-power vacuum diodes with high-atomic-number anodes, a large fraction of the electrons are backscattered, thus changing all diode characteristics: the electron and ion currents [1,2], the electron beam spectrum [3], and, finally, the X-ray spectrum and the X-ray efficiency. The latter problem is very important for intense electron beam radiography. Based on the KARAT [4] and Monte Carlo [5] codes, a hybrid PIC/Monte Carlo code is now being.. developed to examine the above problems. The results of computer simulations are compared with experimental data.

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Access to Document

10.1109/PPPS.2001.1001797