Modification of diode x-rays by electron multiple backscatter from anode

V. V. Ryzhov, V. I. Bespalov, A. V. Kirikov, I. Yu Turchanovsky, V. P. Tarakanov

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

In high-power vacuum diodes with high-atomic-number anodes, a large fraction of the electrons are backscattered, thus changing all diode characteristics: the electron and ion currents [1,2], the electron beam spectrum [3], and, finally, the X-ray spectrum and the X-ray efficiency. The latter problem is very important for intense electron beam radiography. Based on the KARAT [4] and Monte Carlo [5] codes, a hybrid PIC/Monte Carlo code is now being.. developed to examine the above problems. The results of computer simulations are compared with experimental data.

Original languageEnglish
Title of host publicationPPPS 2001 - Pulsed Power Plasma Science 2001
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1336-1339
Number of pages4
Volume2
ISBN (Print)0780371208, 9780780371200
DOIs
Publication statusPublished - 2001
Event28th IEEE International Conference on Plasma Science and 13th IEEE International Pulsed Power Conference, PPPS 2001 - Las Vegas, United States
Duration: 17 Jun 200122 Jun 2001

Other

Other28th IEEE International Conference on Plasma Science and 13th IEEE International Pulsed Power Conference, PPPS 2001
CountryUnited States
CityLas Vegas
Period17.6.0122.6.01

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ASJC Scopus subject areas

  • Energy Engineering and Power Technology
  • Nuclear Energy and Engineering
  • Nuclear and High Energy Physics

Cite this

Ryzhov, V. V., Bespalov, V. I., Kirikov, A. V., Turchanovsky, I. Y., & Tarakanov, V. P. (2001). Modification of diode x-rays by electron multiple backscatter from anode. In PPPS 2001 - Pulsed Power Plasma Science 2001 (Vol. 2, pp. 1336-1339). [1001797] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/PPPS.2001.1001797