Moderne 2-D und 3-D abbildende Röntgenverfahren mit Synchrotronstrahlung

Tilo Baumbach, T. Dos Santos Rolo, A. Ershov, Lukas Helfen, Daniel Lübbert, P. Modregger, Danielle Pelliccia, Patrik Vagovic, Feng Xu

    Research output: Contribution to journalArticle

    Abstract

    The development and production of highly perfect semiconductor materials and their application in components in various branches of technology requires information on their structural perfection. Of crucial importance is the relationship between structural properties and all the technological processing steps, starting from the raw material right up to the completed device. The availability of reliable experimental facilities at synchrotron radiation sources, with unique properties such as high intensity, small focus, high brilliance, and good coherence at the sample opens up advanced possibilities with application potential also for nondestructive testing and characterization of materials and components from research and industry. We illustrate principles and instrumentation of full field imaging methods with synchrotron radiation and examples of application to x-ray inspection, structure and defect analysis. The aim of direct-space imaging methods is the use of the principles of physical interaction for the imaging of micro-structures. Struct. Variations and Defects in A Wide Fld. of Applic.. X-ray Imaging Methods Using Synchrt. Radiat. Have the Potential to Bridge the Gap between Conventional 2D and 3D Direct Imaging Techniques Using Lab. Sources and Electron Microscopic Methods, That Means to Probe the Reg. between 10 im and A Few Nm. Synchrt. Radiat. Is Furthermore Favorable to Investigate Hidden Int. Struct. at Highest Level of Image Contrast and Resolution of Fine Details. X-ray Imaging Methods Are Essentially Non-destructive and Allow the Use and Combination of Various Contrast Mechanisms for the Imaging of the Geometric, Crystallographic, Chem. and Electron. Struct. of Sample Mat.

    Original languageGerman
    Pages (from-to)642-651
    Number of pages10
    JournalMaterialpruefung/Materials Testing
    Volume51
    Issue number10
    Publication statusPublished - 2009

    ASJC Scopus subject areas

    • Mechanical Engineering
    • Mechanics of Materials
    • Materials Science(all)

    Cite this

    Baumbach, T., Rolo, T. D. S., Ershov, A., Helfen, L., Lübbert, D., Modregger, P., ... Xu, F. (2009). Moderne 2-D und 3-D abbildende Röntgenverfahren mit Synchrotronstrahlung. Materialpruefung/Materials Testing, 51(10), 642-651.

    Moderne 2-D und 3-D abbildende Röntgenverfahren mit Synchrotronstrahlung. / Baumbach, Tilo; Rolo, T. Dos Santos; Ershov, A.; Helfen, Lukas; Lübbert, Daniel; Modregger, P.; Pelliccia, Danielle; Vagovic, Patrik; Xu, Feng.

    In: Materialpruefung/Materials Testing, Vol. 51, No. 10, 2009, p. 642-651.

    Research output: Contribution to journalArticle

    Baumbach, T, Rolo, TDS, Ershov, A, Helfen, L, Lübbert, D, Modregger, P, Pelliccia, D, Vagovic, P & Xu, F 2009, 'Moderne 2-D und 3-D abbildende Röntgenverfahren mit Synchrotronstrahlung', Materialpruefung/Materials Testing, vol. 51, no. 10, pp. 642-651.
    Baumbach T, Rolo TDS, Ershov A, Helfen L, Lübbert D, Modregger P et al. Moderne 2-D und 3-D abbildende Röntgenverfahren mit Synchrotronstrahlung. Materialpruefung/Materials Testing. 2009;51(10):642-651.
    Baumbach, Tilo ; Rolo, T. Dos Santos ; Ershov, A. ; Helfen, Lukas ; Lübbert, Daniel ; Modregger, P. ; Pelliccia, Danielle ; Vagovic, Patrik ; Xu, Feng. / Moderne 2-D und 3-D abbildende Röntgenverfahren mit Synchrotronstrahlung. In: Materialpruefung/Materials Testing. 2009 ; Vol. 51, No. 10. pp. 642-651.
    @article{dd3f641246ab49a48427ab6a463d65fc,
    title = "Moderne 2-D und 3-D abbildende R{\"o}ntgenverfahren mit Synchrotronstrahlung",
    abstract = "The development and production of highly perfect semiconductor materials and their application in components in various branches of technology requires information on their structural perfection. Of crucial importance is the relationship between structural properties and all the technological processing steps, starting from the raw material right up to the completed device. The availability of reliable experimental facilities at synchrotron radiation sources, with unique properties such as high intensity, small focus, high brilliance, and good coherence at the sample opens up advanced possibilities with application potential also for nondestructive testing and characterization of materials and components from research and industry. We illustrate principles and instrumentation of full field imaging methods with synchrotron radiation and examples of application to x-ray inspection, structure and defect analysis. The aim of direct-space imaging methods is the use of the principles of physical interaction for the imaging of micro-structures. Struct. Variations and Defects in A Wide Fld. of Applic.. X-ray Imaging Methods Using Synchrt. Radiat. Have the Potential to Bridge the Gap between Conventional 2D and 3D Direct Imaging Techniques Using Lab. Sources and Electron Microscopic Methods, That Means to Probe the Reg. between 10 im and A Few Nm. Synchrt. Radiat. Is Furthermore Favorable to Investigate Hidden Int. Struct. at Highest Level of Image Contrast and Resolution of Fine Details. X-ray Imaging Methods Are Essentially Non-destructive and Allow the Use and Combination of Various Contrast Mechanisms for the Imaging of the Geometric, Crystallographic, Chem. and Electron. Struct. of Sample Mat.",
    author = "Tilo Baumbach and Rolo, {T. Dos Santos} and A. Ershov and Lukas Helfen and Daniel L{\"u}bbert and P. Modregger and Danielle Pelliccia and Patrik Vagovic and Feng Xu",
    year = "2009",
    language = "Немецкий",
    volume = "51",
    pages = "642--651",
    journal = "Materialpruefung/Materials Testing",
    issn = "0025-5300",
    publisher = "Carl Hanser Verlag GmbH & Co. KG",
    number = "10",

    }

    TY - JOUR

    T1 - Moderne 2-D und 3-D abbildende Röntgenverfahren mit Synchrotronstrahlung

    AU - Baumbach, Tilo

    AU - Rolo, T. Dos Santos

    AU - Ershov, A.

    AU - Helfen, Lukas

    AU - Lübbert, Daniel

    AU - Modregger, P.

    AU - Pelliccia, Danielle

    AU - Vagovic, Patrik

    AU - Xu, Feng

    PY - 2009

    Y1 - 2009

    N2 - The development and production of highly perfect semiconductor materials and their application in components in various branches of technology requires information on their structural perfection. Of crucial importance is the relationship between structural properties and all the technological processing steps, starting from the raw material right up to the completed device. The availability of reliable experimental facilities at synchrotron radiation sources, with unique properties such as high intensity, small focus, high brilliance, and good coherence at the sample opens up advanced possibilities with application potential also for nondestructive testing and characterization of materials and components from research and industry. We illustrate principles and instrumentation of full field imaging methods with synchrotron radiation and examples of application to x-ray inspection, structure and defect analysis. The aim of direct-space imaging methods is the use of the principles of physical interaction for the imaging of micro-structures. Struct. Variations and Defects in A Wide Fld. of Applic.. X-ray Imaging Methods Using Synchrt. Radiat. Have the Potential to Bridge the Gap between Conventional 2D and 3D Direct Imaging Techniques Using Lab. Sources and Electron Microscopic Methods, That Means to Probe the Reg. between 10 im and A Few Nm. Synchrt. Radiat. Is Furthermore Favorable to Investigate Hidden Int. Struct. at Highest Level of Image Contrast and Resolution of Fine Details. X-ray Imaging Methods Are Essentially Non-destructive and Allow the Use and Combination of Various Contrast Mechanisms for the Imaging of the Geometric, Crystallographic, Chem. and Electron. Struct. of Sample Mat.

    AB - The development and production of highly perfect semiconductor materials and their application in components in various branches of technology requires information on their structural perfection. Of crucial importance is the relationship between structural properties and all the technological processing steps, starting from the raw material right up to the completed device. The availability of reliable experimental facilities at synchrotron radiation sources, with unique properties such as high intensity, small focus, high brilliance, and good coherence at the sample opens up advanced possibilities with application potential also for nondestructive testing and characterization of materials and components from research and industry. We illustrate principles and instrumentation of full field imaging methods with synchrotron radiation and examples of application to x-ray inspection, structure and defect analysis. The aim of direct-space imaging methods is the use of the principles of physical interaction for the imaging of micro-structures. Struct. Variations and Defects in A Wide Fld. of Applic.. X-ray Imaging Methods Using Synchrt. Radiat. Have the Potential to Bridge the Gap between Conventional 2D and 3D Direct Imaging Techniques Using Lab. Sources and Electron Microscopic Methods, That Means to Probe the Reg. between 10 im and A Few Nm. Synchrt. Radiat. Is Furthermore Favorable to Investigate Hidden Int. Struct. at Highest Level of Image Contrast and Resolution of Fine Details. X-ray Imaging Methods Are Essentially Non-destructive and Allow the Use and Combination of Various Contrast Mechanisms for the Imaging of the Geometric, Crystallographic, Chem. and Electron. Struct. of Sample Mat.

    UR - http://www.scopus.com/inward/record.url?scp=71049164760&partnerID=8YFLogxK

    UR - http://www.scopus.com/inward/citedby.url?scp=71049164760&partnerID=8YFLogxK

    M3 - Статья

    AN - SCOPUS:71049164760

    VL - 51

    SP - 642

    EP - 651

    JO - Materialpruefung/Materials Testing

    JF - Materialpruefung/Materials Testing

    SN - 0025-5300

    IS - 10

    ER -