Micron-scale vertical beam size measurements based on transition radiation imaging with a Schwarzschild objective

L. G. Sukhikh, A. P. Potylitsyn, A. V. Vukolov, S. Bajt, G. Kube, I. A. Artyukov, W. Lauth

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

This report presents preliminary results of a measurement of a micron–scale vertical beam size based on imaging of optical transition radiation in the visible region. The visualization of point spread function dominated beam images was carried out using a Schwarzschild objective that provides high magnification and that is free of some of aberrations. According to the preliminary data treatment, a vertical rms beam size of 1.37 ± 0.07 µm was measured at the 855 MeV beam of the Mainz Microtron MAMI (Germany).

Original languageEnglish
Title of host publicationProceedings of the 4th International Beam Instrumentation Conference, IBIC 2015
PublisherJoint Accelerator Conferences Website (JACoW)
Pages327-329
Number of pages3
ISBN (Electronic)9783954501762
Publication statusPublished - 1 Jan 2015
Event4th International Beam Instrumentation Conference, IBIC 2015 - Melbourne, Australia
Duration: 13 Sep 201517 Sep 2015

Publication series

NameProceedings of the 4th International Beam Instrumentation Conference, IBIC 2015

Conference

Conference4th International Beam Instrumentation Conference, IBIC 2015
CountryAustralia
CityMelbourne
Period13.9.1517.9.15

ASJC Scopus subject areas

  • Instrumentation
  • Nuclear and High Energy Physics

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    Sukhikh, L. G., Potylitsyn, A. P., Vukolov, A. V., Bajt, S., Kube, G., Artyukov, I. A., & Lauth, W. (2015). Micron-scale vertical beam size measurements based on transition radiation imaging with a Schwarzschild objective. In Proceedings of the 4th International Beam Instrumentation Conference, IBIC 2015 (pp. 327-329). (Proceedings of the 4th International Beam Instrumentation Conference, IBIC 2015). Joint Accelerator Conferences Website (JACoW).