The paper presents the implementation of diffraction and spectral analysis methods allowing 1 μm resolution enhancement of optical instruments intended for measurements of such round wire materials as cables, wires, cords, etc. with diameters exceeding the wavelength (∼0.5 mm and large). The transformation function suggested allows detecting geometrical boundaries of object's shadows that are used to calculate its diameter independently from its location in the gaging zone. The real-time detection algorithm is described for diffraction extreme values in the analog video signal produced by the chargecoupled device sensors. A method of additional improvement of resolution is shown on the basis of spectral analysis.
- In-process diameter measurement
- Spectral analysis
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Electrical and Electronic Engineering
- Atomic and Molecular Physics, and Optics