Methods and devices for noncontact express measurement of the main electro-physical parameters of polysilicon and multysilicon used for solar cells production

Alexey Yurchenko, Alena Ohorzina, Kirill Nikcolenko

Research School of High-Energy Physics

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

The paper considers the technique for measuring specific electric resistance and charge carriers recombination life time in silicon plates used for manufacturing of photo-electric converters.

Original language	English
Title of host publication	Proceedings - 2012 7th International Forum on Strategic Technology, IFOST 2012
DOIs	https://doi.org/10.1109/IFOST.2012.6357754
Publication status	Published - 2012
Event	2012 7th International Forum on Strategic Technology, IFOST 2012 - Tomsk, Russian Federation Duration: 18 Sep 2012 → 21 Sep 2012

Other

Other	2012 7th International Forum on Strategic Technology, IFOST 2012
Country	Russian Federation
City	Tomsk
Period	18.9.12 → 21.9.12

Fingerprint

Electric converters

Charge carriers

Polysilicon

Solar cells

Silicon

Keywords

Electrical Properties
Multicrystalline Silicon

ASJC Scopus subject areas

Management of Technology and Innovation

Cite this

Yurchenko, A., Ohorzina, A., & Nikcolenko, K. (2012). Methods and devices for noncontact express measurement of the main electro-physical parameters of polysilicon and multysilicon used for solar cells production. In Proceedings - 2012 7th International Forum on Strategic Technology, IFOST 2012 [6357754] https://doi.org/10.1109/IFOST.2012.6357754

Methods and devices for noncontact express measurement of the main electro-physical parameters of polysilicon and multysilicon used for solar cells production. / Yurchenko, Alexey; Ohorzina, Alena; Nikcolenko, Kirill.

Proceedings - 2012 7th International Forum on Strategic Technology, IFOST 2012. 2012. 6357754.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Yurchenko, A, Ohorzina, A & Nikcolenko, K 2012, Methods and devices for noncontact express measurement of the main electro-physical parameters of polysilicon and multysilicon used for solar cells production. in Proceedings - 2012 7th International Forum on Strategic Technology, IFOST 2012., 6357754, 2012 7th International Forum on Strategic Technology, IFOST 2012, Tomsk, Russian Federation, 18.9.12. https://doi.org/10.1109/IFOST.2012.6357754

Yurchenko A, Ohorzina A, Nikcolenko K. Methods and devices for noncontact express measurement of the main electro-physical parameters of polysilicon and multysilicon used for solar cells production. In Proceedings - 2012 7th International Forum on Strategic Technology, IFOST 2012. 2012. 6357754 https://doi.org/10.1109/IFOST.2012.6357754

Yurchenko, Alexey ; Ohorzina, Alena ; Nikcolenko, Kirill. / Methods and devices for noncontact express measurement of the main electro-physical parameters of polysilicon and multysilicon used for solar cells production. Proceedings - 2012 7th International Forum on Strategic Technology, IFOST 2012. 2012.

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Access to Document

10.1109/IFOST.2012.6357754