Methods and devices for noncontact express measurement of the main electro-physical parameters of polysilicon and multysilicon used for solar cells production

Alexey Yurchenko, Alena Ohorzina, Kirill Nikcolenko

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The paper considers the technique for measuring specific electric resistance and charge carriers recombination life time in silicon plates used for manufacturing of photo-electric converters.

Original languageEnglish
Title of host publicationProceedings - 2012 7th International Forum on Strategic Technology, IFOST 2012
DOIs
Publication statusPublished - 2012
Event2012 7th International Forum on Strategic Technology, IFOST 2012 - Tomsk, Russian Federation
Duration: 18 Sep 201221 Sep 2012

Other

Other2012 7th International Forum on Strategic Technology, IFOST 2012
CountryRussian Federation
CityTomsk
Period18.9.1221.9.12

Fingerprint

Electric converters
Charge carriers
Polysilicon
Solar cells
Silicon

Keywords

  • Electrical Properties
  • Multicrystalline Silicon

ASJC Scopus subject areas

  • Management of Technology and Innovation

Cite this

Methods and devices for noncontact express measurement of the main electro-physical parameters of polysilicon and multysilicon used for solar cells production. / Yurchenko, Alexey; Ohorzina, Alena; Nikcolenko, Kirill.

Proceedings - 2012 7th International Forum on Strategic Technology, IFOST 2012. 2012. 6357754.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Yurchenko, A, Ohorzina, A & Nikcolenko, K 2012, Methods and devices for noncontact express measurement of the main electro-physical parameters of polysilicon and multysilicon used for solar cells production. in Proceedings - 2012 7th International Forum on Strategic Technology, IFOST 2012., 6357754, 2012 7th International Forum on Strategic Technology, IFOST 2012, Tomsk, Russian Federation, 18.9.12. https://doi.org/10.1109/IFOST.2012.6357754
Yurchenko, Alexey ; Ohorzina, Alena ; Nikcolenko, Kirill. / Methods and devices for noncontact express measurement of the main electro-physical parameters of polysilicon and multysilicon used for solar cells production. Proceedings - 2012 7th International Forum on Strategic Technology, IFOST 2012. 2012.
@inproceedings{38ac87869dcd48518d937edea740fea4,
title = "Methods and devices for noncontact express measurement of the main electro-physical parameters of polysilicon and multysilicon used for solar cells production",
abstract = "The paper considers the technique for measuring specific electric resistance and charge carriers recombination life time in silicon plates used for manufacturing of photo-electric converters.",
keywords = "Electrical Properties, Multicrystalline Silicon",
author = "Alexey Yurchenko and Alena Ohorzina and Kirill Nikcolenko",
year = "2012",
doi = "10.1109/IFOST.2012.6357754",
language = "English",
isbn = "9781467317702",
booktitle = "Proceedings - 2012 7th International Forum on Strategic Technology, IFOST 2012",

}

TY - GEN

T1 - Methods and devices for noncontact express measurement of the main electro-physical parameters of polysilicon and multysilicon used for solar cells production

AU - Yurchenko, Alexey

AU - Ohorzina, Alena

AU - Nikcolenko, Kirill

PY - 2012

Y1 - 2012

N2 - The paper considers the technique for measuring specific electric resistance and charge carriers recombination life time in silicon plates used for manufacturing of photo-electric converters.

AB - The paper considers the technique for measuring specific electric resistance and charge carriers recombination life time in silicon plates used for manufacturing of photo-electric converters.

KW - Electrical Properties

KW - Multicrystalline Silicon

UR - http://www.scopus.com/inward/record.url?scp=84871824298&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84871824298&partnerID=8YFLogxK

U2 - 10.1109/IFOST.2012.6357754

DO - 10.1109/IFOST.2012.6357754

M3 - Conference contribution

AN - SCOPUS:84871824298

SN - 9781467317702

BT - Proceedings - 2012 7th International Forum on Strategic Technology, IFOST 2012

ER -