Methods and devices for noncontact express measurement of the main electro-physical parameters of polysilicon and multysilicon used for solar cells production

Alexey Yurchenko, Alena Ohorzina, Kirill Nikcolenko

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

The paper considers the technique for measuring specific electric resistance and charge carriers recombination life time in silicon plates used for manufacturing of photo-electric converters.

Original languageEnglish
Title of host publicationProceedings - 2012 7th International Forum on Strategic Technology, IFOST 2012
DOIs
Publication statusPublished - 2012
Event2012 7th International Forum on Strategic Technology, IFOST 2012 - Tomsk, Russian Federation
Duration: 18 Sep 2012 → 21 Sep 2012

Other

Other2012 7th International Forum on Strategic Technology, IFOST 2012
CountryRussian Federation
CityTomsk
Period18.9.12 → 21.9.12

Keywords

  • Electrical Properties
  • Multicrystalline Silicon

ASJC Scopus subject areas

  • Management of Technology and Innovation

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