Abstract
The paper considers the technique for measuring specific electric resistance and charge carriers recombination life time in silicon plates used for manufacturing of photo-electric converters.
Original language | English |
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Title of host publication | Proceedings - 2012 7th International Forum on Strategic Technology, IFOST 2012 |
DOIs | |
Publication status | Published - 2012 |
Event | 2012 7th International Forum on Strategic Technology, IFOST 2012 - Tomsk, Russian Federation Duration: 18 Sep 2012 → 21 Sep 2012 |
Other
Other | 2012 7th International Forum on Strategic Technology, IFOST 2012 |
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Country | Russian Federation |
City | Tomsk |
Period | 18.9.12 → 21.9.12 |
Keywords
- Electrical Properties
- Multicrystalline Silicon
ASJC Scopus subject areas
- Management of Technology and Innovation