Abstract
The paper considers the technique for measuring specific electric resistance and charge carriers recombination life time in silicon plates used for manufacturing of photo-electric converters.
| Original language | English |
|---|---|
| Title of host publication | Proceedings - 2012 7th International Forum on Strategic Technology, IFOST 2012 |
| DOIs | |
| Publication status | Published - 2012 |
| Event | 2012 7th International Forum on Strategic Technology, IFOST 2012 - Tomsk, Russian Federation Duration: 18 Sep 2012 → 21 Sep 2012 |
Other
| Other | 2012 7th International Forum on Strategic Technology, IFOST 2012 |
|---|---|
| Country | Russian Federation |
| City | Tomsk |
| Period | 18.9.12 → 21.9.12 |
Keywords
- Electrical Properties
- Multicrystalline Silicon
ASJC Scopus subject areas
- Management of Technology and Innovation
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Yurchenko, A., Ohorzina, A., & Nikcolenko, K. (2012). Methods and devices for noncontact express measurement of the main electro-physical parameters of polysilicon and multysilicon used for solar cells production. In Proceedings - 2012 7th International Forum on Strategic Technology, IFOST 2012 [6357754] https://doi.org/10.1109/IFOST.2012.6357754