Method of state and alignment monitoring for crystal deflectors of relativistic ions

A. Gogolev, S. Uglov, A. Taratin

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

The calculations of the parametric X-ray radiation (PXR) characteristics produced by 158 GeV/u Pb nuclei in silicon crystal deflectors were carried out. The PXR intensity at the maximum angular distribution was about 4 ph/Pb/sr, which should allow to monitor the state and the orientation of the deflector by means of the observation of the PXR spectrum characteristics.

Original languageEnglish
Title of host publicationRuPAC 2012 Contributions to the Proceedings - 23rd Russian Particle Accelerator Conference
Pages200-202
Number of pages3
Publication statusPublished - 2012
Event23rd Russian Particle Accelerator Conference, RuPAC 2012 - Saint-Petersburg, Russian Federation
Duration: 24 Sep 201228 Sep 2012

Other

Other23rd Russian Particle Accelerator Conference, RuPAC 2012
CountryRussian Federation
CitySaint-Petersburg
Period24.9.1228.9.12

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ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

Cite this

Gogolev, A., Uglov, S., & Taratin, A. (2012). Method of state and alignment monitoring for crystal deflectors of relativistic ions. In RuPAC 2012 Contributions to the Proceedings - 23rd Russian Particle Accelerator Conference (pp. 200-202)