Abstract
A spectrometic method of inspection is proposed and analyzed which uses a beam of fast monoenergetic electrons for identifying the defective layer of two-layer product samples by probing them from both sides, that of the light-atom layer and that of the heavy-atom layer.
| Original language | English |
|---|---|
| Title of host publication | The Soviet journal of nondestructive testing |
| Pages | 902-905 |
| Number of pages | 4 |
| Volume | 17 |
| Edition | 12 |
| Publication status | Published - Dec 1981 |
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ASJC Scopus subject areas
- Engineering(all)
Cite this
METHOD OF FINDING THE DEFECTIVE LAYER OF TWO-LAYER PRODUCT SAMPLES DURING SPECTROMETRIC ELECTRON DEFECTOSCOPY. / Lisin, V. A.; Stepanov, Yu M.; Yalovets, A. P.
The Soviet journal of nondestructive testing. Vol. 17 12. ed. 1981. p. 902-905.Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
}
TY - GEN
T1 - METHOD OF FINDING THE DEFECTIVE LAYER OF TWO-LAYER PRODUCT SAMPLES DURING SPECTROMETRIC ELECTRON DEFECTOSCOPY.
AU - Lisin, V. A.
AU - Stepanov, Yu M.
AU - Yalovets, A. P.
PY - 1981/12
Y1 - 1981/12
N2 - A spectrometic method of inspection is proposed and analyzed which uses a beam of fast monoenergetic electrons for identifying the defective layer of two-layer product samples by probing them from both sides, that of the light-atom layer and that of the heavy-atom layer.
AB - A spectrometic method of inspection is proposed and analyzed which uses a beam of fast monoenergetic electrons for identifying the defective layer of two-layer product samples by probing them from both sides, that of the light-atom layer and that of the heavy-atom layer.
UR - http://www.scopus.com/inward/record.url?scp=4243368762&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=4243368762&partnerID=8YFLogxK
M3 - Conference contribution
AN - SCOPUS:4243368762
VL - 17
SP - 902
EP - 905
BT - The Soviet journal of nondestructive testing
ER -