METHOD OF FINDING THE DEFECTIVE LAYER OF TWO-LAYER PRODUCT SAMPLES DURING SPECTROMETRIC ELECTRON DEFECTOSCOPY.

V. A. Lisin, Yu M. Stepanov, A. P. Yalovets

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

    Abstract

    A spectrometic method of inspection is proposed and analyzed which uses a beam of fast monoenergetic electrons for identifying the defective layer of two-layer product samples by probing them from both sides, that of the light-atom layer and that of the heavy-atom layer.

    Original languageEnglish
    Title of host publicationThe Soviet journal of nondestructive testing
    Pages902-905
    Number of pages4
    Volume17
    Edition12
    Publication statusPublished - Dec 1981

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    Atoms
    Electrons
    Inspection

    ASJC Scopus subject areas

    • Engineering(all)

    Cite this

    Lisin, V. A., Stepanov, Y. M., & Yalovets, A. P. (1981). METHOD OF FINDING THE DEFECTIVE LAYER OF TWO-LAYER PRODUCT SAMPLES DURING SPECTROMETRIC ELECTRON DEFECTOSCOPY. In The Soviet journal of nondestructive testing (12 ed., Vol. 17, pp. 902-905)

    METHOD OF FINDING THE DEFECTIVE LAYER OF TWO-LAYER PRODUCT SAMPLES DURING SPECTROMETRIC ELECTRON DEFECTOSCOPY. / Lisin, V. A.; Stepanov, Yu M.; Yalovets, A. P.

    The Soviet journal of nondestructive testing. Vol. 17 12. ed. 1981. p. 902-905.

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

    Lisin, VA, Stepanov, YM & Yalovets, AP 1981, METHOD OF FINDING THE DEFECTIVE LAYER OF TWO-LAYER PRODUCT SAMPLES DURING SPECTROMETRIC ELECTRON DEFECTOSCOPY. in The Soviet journal of nondestructive testing. 12 edn, vol. 17, pp. 902-905.
    Lisin VA, Stepanov YM, Yalovets AP. METHOD OF FINDING THE DEFECTIVE LAYER OF TWO-LAYER PRODUCT SAMPLES DURING SPECTROMETRIC ELECTRON DEFECTOSCOPY. In The Soviet journal of nondestructive testing. 12 ed. Vol. 17. 1981. p. 902-905
    Lisin, V. A. ; Stepanov, Yu M. ; Yalovets, A. P. / METHOD OF FINDING THE DEFECTIVE LAYER OF TWO-LAYER PRODUCT SAMPLES DURING SPECTROMETRIC ELECTRON DEFECTOSCOPY. The Soviet journal of nondestructive testing. Vol. 17 12. ed. 1981. pp. 902-905
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    abstract = "A spectrometic method of inspection is proposed and analyzed which uses a beam of fast monoenergetic electrons for identifying the defective layer of two-layer product samples by probing them from both sides, that of the light-atom layer and that of the heavy-atom layer.",
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    AU - Yalovets, A. P.

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