METHOD OF FINDING THE DEFECTIVE LAYER OF TWO-LAYER PRODUCT SAMPLES DURING SPECTROMETRIC ELECTRON DEFECTOSCOPY.

Abstract

A spectrometic method of inspection is proposed and analyzed which uses a beam of fast monoenergetic electrons for identifying the defective layer of two-layer product samples by probing them from both sides, that of the light-atom layer and that of the heavy-atom layer.

Original language	English
Title of host publication	The Soviet journal of nondestructive testing
Pages	902-905
Number of pages	4
Volume	17
Edition	12
Publication status	Published - Dec 1981

ASJC Scopus subject areas

Engineering(all)

Fingerprint Dive into the research topics of 'METHOD OF FINDING THE DEFECTIVE LAYER OF TWO-LAYER PRODUCT SAMPLES DURING SPECTROMETRIC ELECTRON DEFECTOSCOPY.'. Together they form a unique fingerprint.

Cite this

@inproceedings{98295dc546884ee680174197d1697bd8,

title = "METHOD OF FINDING THE DEFECTIVE LAYER OF TWO-LAYER PRODUCT SAMPLES DURING SPECTROMETRIC ELECTRON DEFECTOSCOPY.",

abstract = "A spectrometic method of inspection is proposed and analyzed which uses a beam of fast monoenergetic electrons for identifying the defective layer of two-layer product samples by probing them from both sides, that of the light-atom layer and that of the heavy-atom layer.",

author = "Lisin, {V. A.} and Stepanov, {Yu M.} and Yalovets, {A. P.}",

year = "1981",

month = dec,

language = "English",

volume = "17",

pages = "902--905",

booktitle = "The Soviet journal of nondestructive testing",

edition = "12",

}

TY - GEN

T1 - METHOD OF FINDING THE DEFECTIVE LAYER OF TWO-LAYER PRODUCT SAMPLES DURING SPECTROMETRIC ELECTRON DEFECTOSCOPY.

AU - Lisin, V. A.

AU - Stepanov, Yu M.

AU - Yalovets, A. P.

PY - 1981/12

Y1 - 1981/12

N2 - A spectrometic method of inspection is proposed and analyzed which uses a beam of fast monoenergetic electrons for identifying the defective layer of two-layer product samples by probing them from both sides, that of the light-atom layer and that of the heavy-atom layer.

AB - A spectrometic method of inspection is proposed and analyzed which uses a beam of fast monoenergetic electrons for identifying the defective layer of two-layer product samples by probing them from both sides, that of the light-atom layer and that of the heavy-atom layer.

UR - http://www.scopus.com/inward/record.url?scp=4243368762&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=4243368762&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:4243368762

VL - 17

SP - 902

EP - 905

BT - The Soviet journal of nondestructive testing

ER -