Abstract
A spectrometic method of inspection is proposed and analyzed which uses a beam of fast monoenergetic electrons for identifying the defective layer of two-layer product samples by probing them from both sides, that of the light-atom layer and that of the heavy-atom layer.
Original language | English |
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Title of host publication | The Soviet journal of nondestructive testing |
Pages | 902-905 |
Number of pages | 4 |
Volume | 17 |
Edition | 12 |
Publication status | Published - Dec 1981 |
ASJC Scopus subject areas
- Engineering(all)