Abstract
A spectrometic method of inspection is proposed and analyzed which uses a beam of fast monoenergetic electrons for identifying the defective layer of two-layer product samples by probing them from both sides, that of the light-atom layer and that of the heavy-atom layer.
| Original language | English |
|---|---|
| Title of host publication | The Soviet journal of nondestructive testing |
| Pages | 902-905 |
| Number of pages | 4 |
| Volume | 17 |
| Edition | 12 |
| Publication status | Published - Dec 1981 |
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ASJC Scopus subject areas
- Engineering(all)
Cite this
Lisin, V. A., Stepanov, Y. M., & Yalovets, A. P. (1981). METHOD OF FINDING THE DEFECTIVE LAYER OF TWO-LAYER PRODUCT SAMPLES DURING SPECTROMETRIC ELECTRON DEFECTOSCOPY. In The Soviet journal of nondestructive testing (12 ed., Vol. 17, pp. 902-905)