METHOD OF FINDING THE DEFECTIVE LAYER OF TWO-LAYER PRODUCT SAMPLES DURING SPECTROMETRIC ELECTRON DEFECTOSCOPY.

V. A. Lisin, Yu M. Stepanov, A. P. Yalovets

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

    Abstract

    A spectrometic method of inspection is proposed and analyzed which uses a beam of fast monoenergetic electrons for identifying the defective layer of two-layer product samples by probing them from both sides, that of the light-atom layer and that of the heavy-atom layer.

    Original languageEnglish
    Title of host publicationThe Soviet journal of nondestructive testing
    Pages902-905
    Number of pages4
    Volume17
    Edition12
    Publication statusPublished - Dec 1981

    ASJC Scopus subject areas

    • Engineering(all)

    Access to Document

    Fingerprint Dive into the research topics of 'METHOD OF FINDING THE DEFECTIVE LAYER OF TWO-LAYER PRODUCT SAMPLES DURING SPECTROMETRIC ELECTRON DEFECTOSCOPY.'. Together they form a unique fingerprint.

    • Cite this

    Lisin, V. A., Stepanov, Y. M., & Yalovets, A. P. (1981). METHOD OF FINDING THE DEFECTIVE LAYER OF TWO-LAYER PRODUCT SAMPLES DURING SPECTROMETRIC ELECTRON DEFECTOSCOPY. In The Soviet journal of nondestructive testing (12 ed., Vol. 17, pp. 902-905)