Mesoscopic investigation of plastic deformation at compositions extension with intermetallic coating laid by method of electron-beam melting

S. V. Panin, Sh A. Baibulatov, V. G. Durakov

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The authors investigated electron beam melting (EBM)-compositions with intermetallic coatings on the basis of PT-Yu10N powder, coating of Ni-Al system, used as a rule for coating sublayers increasing strength of coatings and base adherence. For certification of such compositions optical-television complex of high resolution TOMSC was used allowing investigations of the behavior of loaded material on meso and macroscopic scaled levels to be performed.

Original languageEnglish
Title of host publicationProceedings of the 7th International Scientific and Practical Conference of Students, Post-Graduates and Young Scientists: Modern Techniques and Technology, MTT 2001
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages125-127
Number of pages3
ISBN (Print)0780363469, 9780780363465
DOIs
Publication statusPublished - 2001
Event7th International Scientific and Practical Conference of Students, Post-Graduates and Young Scientists on Modern Techniques and Technology, MTT 2001 - Tomsk, Russian Federation
Duration: 26 Feb 20012 Mar 2001

Other

Other7th International Scientific and Practical Conference of Students, Post-Graduates and Young Scientists on Modern Techniques and Technology, MTT 2001
CountryRussian Federation
CityTomsk
Period26.2.012.3.01

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ASJC Scopus subject areas

  • Biotechnology
  • Computer Science Applications
  • Civil and Structural Engineering
  • Mechanical Engineering
  • Materials Science (miscellaneous)
  • Instrumentation
  • Education

Cite this

Panin, S. V., Baibulatov, S. A., & Durakov, V. G. (2001). Mesoscopic investigation of plastic deformation at compositions extension with intermetallic coating laid by method of electron-beam melting. In Proceedings of the 7th International Scientific and Practical Conference of Students, Post-Graduates and Young Scientists: Modern Techniques and Technology, MTT 2001 (pp. 125-127). [983765] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/MTT.2001.983765