Mechanical properties and applications of custom-built gold AFM cantilevers

Vladimir A. Kolchuzhin, Evgeniya Sheremet, Kunal Bhattacharya, Raul D. Rodriguez, Soumya Deep Paul, Jan Mehner, Michael Hietschold, Dietrich R.T. Zahn

Research output: Contribution to journalArticle

5 Citations (Scopus)

Abstract

Silicon and silicon nitride metal-coated cantilevers have been in use for a long time in several scanning probe microscopy applications that require electrically conductive probes. However, conventional metalized cantilevers present several drawbacks such as limited life-time of the metal layer due to wear, and increased tip radius. This work focuses on monolithic metallic cantilevers developed in order to overcome the limitations of conventional metalized atomic force microscopy (AFM) probes. These custom-made cantilevers are designed for several applications such as in current-sensing AFM (CSAFM), Kelvin probe force microscopy (KPFM), and tip-enhanced Raman spectroscopy (TERS). Determination of the dynamic and static mechanical properties of these cantilevers in a non-destructive way is reported here. Key parameters under investigation are the cantilever spring constant and the frequency response using finite element method (FEM). Gold cantilevers are selected for this study, which allow optimizing the design and the process of developing these metallic cantilevers with parameters engineered for the applications mentioned above. This work contributes to the establishment and applicability of custom-made probes in advanced scanning probe microscopy methods and their performance understanding using computer simulations.

Original languageEnglish
Pages (from-to)281-286
Number of pages6
JournalMechatronics
Volume40
DOIs
Publication statusPublished - 1 Dec 2016
Externally publishedYes

Fingerprint

Atomic force microscopy
Gold
Scanning probe microscopy
Mechanical properties
Metals
Silicon nitride
Frequency response
Raman spectroscopy
Microscopic examination
Wear of materials
Finite element method
Silicon
Computer simulation

Keywords

  • Atomic force microscopy (AFM)
  • Cantilevers
  • Current-sensing AFM (CSAFM)
  • Finite element method simulations (FEM simulations)
  • Kelvin–Probe force microscopy (KPFM)
  • scanning probe microscopy (SPM)
  • Tip-enhanced Raman spectroscopy (TERS)

ASJC Scopus subject areas

  • Mechanical Engineering
  • Computer Science Applications
  • Electrical and Electronic Engineering

Cite this

Mechanical properties and applications of custom-built gold AFM cantilevers. / Kolchuzhin, Vladimir A.; Sheremet, Evgeniya; Bhattacharya, Kunal; Rodriguez, Raul D.; Paul, Soumya Deep; Mehner, Jan; Hietschold, Michael; Zahn, Dietrich R.T.

In: Mechatronics, Vol. 40, 01.12.2016, p. 281-286.

Research output: Contribution to journalArticle

Kolchuzhin, VA, Sheremet, E, Bhattacharya, K, Rodriguez, RD, Paul, SD, Mehner, J, Hietschold, M & Zahn, DRT 2016, 'Mechanical properties and applications of custom-built gold AFM cantilevers', Mechatronics, vol. 40, pp. 281-286. https://doi.org/10.1016/j.mechatronics.2016.05.015
Kolchuzhin, Vladimir A. ; Sheremet, Evgeniya ; Bhattacharya, Kunal ; Rodriguez, Raul D. ; Paul, Soumya Deep ; Mehner, Jan ; Hietschold, Michael ; Zahn, Dietrich R.T. / Mechanical properties and applications of custom-built gold AFM cantilevers. In: Mechatronics. 2016 ; Vol. 40. pp. 281-286.
@article{50c2d03abc8f41f79ddf044b66f39299,
title = "Mechanical properties and applications of custom-built gold AFM cantilevers",
abstract = "Silicon and silicon nitride metal-coated cantilevers have been in use for a long time in several scanning probe microscopy applications that require electrically conductive probes. However, conventional metalized cantilevers present several drawbacks such as limited life-time of the metal layer due to wear, and increased tip radius. This work focuses on monolithic metallic cantilevers developed in order to overcome the limitations of conventional metalized atomic force microscopy (AFM) probes. These custom-made cantilevers are designed for several applications such as in current-sensing AFM (CSAFM), Kelvin probe force microscopy (KPFM), and tip-enhanced Raman spectroscopy (TERS). Determination of the dynamic and static mechanical properties of these cantilevers in a non-destructive way is reported here. Key parameters under investigation are the cantilever spring constant and the frequency response using finite element method (FEM). Gold cantilevers are selected for this study, which allow optimizing the design and the process of developing these metallic cantilevers with parameters engineered for the applications mentioned above. This work contributes to the establishment and applicability of custom-made probes in advanced scanning probe microscopy methods and their performance understanding using computer simulations.",
keywords = "Atomic force microscopy (AFM), Cantilevers, Current-sensing AFM (CSAFM), Finite element method simulations (FEM simulations), Kelvin–Probe force microscopy (KPFM), scanning probe microscopy (SPM), Tip-enhanced Raman spectroscopy (TERS)",
author = "Kolchuzhin, {Vladimir A.} and Evgeniya Sheremet and Kunal Bhattacharya and Rodriguez, {Raul D.} and Paul, {Soumya Deep} and Jan Mehner and Michael Hietschold and Zahn, {Dietrich R.T.}",
year = "2016",
month = "12",
day = "1",
doi = "10.1016/j.mechatronics.2016.05.015",
language = "English",
volume = "40",
pages = "281--286",
journal = "Mechatronics",
issn = "0957-4158",
publisher = "Elsevier Limited",

}

TY - JOUR

T1 - Mechanical properties and applications of custom-built gold AFM cantilevers

AU - Kolchuzhin, Vladimir A.

AU - Sheremet, Evgeniya

AU - Bhattacharya, Kunal

AU - Rodriguez, Raul D.

AU - Paul, Soumya Deep

AU - Mehner, Jan

AU - Hietschold, Michael

AU - Zahn, Dietrich R.T.

PY - 2016/12/1

Y1 - 2016/12/1

N2 - Silicon and silicon nitride metal-coated cantilevers have been in use for a long time in several scanning probe microscopy applications that require electrically conductive probes. However, conventional metalized cantilevers present several drawbacks such as limited life-time of the metal layer due to wear, and increased tip radius. This work focuses on monolithic metallic cantilevers developed in order to overcome the limitations of conventional metalized atomic force microscopy (AFM) probes. These custom-made cantilevers are designed for several applications such as in current-sensing AFM (CSAFM), Kelvin probe force microscopy (KPFM), and tip-enhanced Raman spectroscopy (TERS). Determination of the dynamic and static mechanical properties of these cantilevers in a non-destructive way is reported here. Key parameters under investigation are the cantilever spring constant and the frequency response using finite element method (FEM). Gold cantilevers are selected for this study, which allow optimizing the design and the process of developing these metallic cantilevers with parameters engineered for the applications mentioned above. This work contributes to the establishment and applicability of custom-made probes in advanced scanning probe microscopy methods and their performance understanding using computer simulations.

AB - Silicon and silicon nitride metal-coated cantilevers have been in use for a long time in several scanning probe microscopy applications that require electrically conductive probes. However, conventional metalized cantilevers present several drawbacks such as limited life-time of the metal layer due to wear, and increased tip radius. This work focuses on monolithic metallic cantilevers developed in order to overcome the limitations of conventional metalized atomic force microscopy (AFM) probes. These custom-made cantilevers are designed for several applications such as in current-sensing AFM (CSAFM), Kelvin probe force microscopy (KPFM), and tip-enhanced Raman spectroscopy (TERS). Determination of the dynamic and static mechanical properties of these cantilevers in a non-destructive way is reported here. Key parameters under investigation are the cantilever spring constant and the frequency response using finite element method (FEM). Gold cantilevers are selected for this study, which allow optimizing the design and the process of developing these metallic cantilevers with parameters engineered for the applications mentioned above. This work contributes to the establishment and applicability of custom-made probes in advanced scanning probe microscopy methods and their performance understanding using computer simulations.

KW - Atomic force microscopy (AFM)

KW - Cantilevers

KW - Current-sensing AFM (CSAFM)

KW - Finite element method simulations (FEM simulations)

KW - Kelvin–Probe force microscopy (KPFM)

KW - scanning probe microscopy (SPM)

KW - Tip-enhanced Raman spectroscopy (TERS)

UR - http://www.scopus.com/inward/record.url?scp=84971613831&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84971613831&partnerID=8YFLogxK

U2 - 10.1016/j.mechatronics.2016.05.015

DO - 10.1016/j.mechatronics.2016.05.015

M3 - Article

AN - SCOPUS:84971613831

VL - 40

SP - 281

EP - 286

JO - Mechatronics

JF - Mechatronics

SN - 0957-4158

ER -