Measurements of parametric X-rays from relativistic electrons in silicon crystals

Yu N. Adishchev, A. N. Didenko, V. V. Mun, G. A. Pleshkov, A. P. Potylitsin, V. K. Tomchakov, S. R. Uglov, S. A. Vorobiev

Research output: Contribution to journalArticle

23 Citations (Scopus)

Abstract

Spectral and angular distributions of parametric X-rays have been measured for (200-900) MeV electrons from Si single crystal. The parametric X-rays were observed at an angle θ = 19° relative to the beam of electrons, which intersects the (110) or (111) Si crystallographic planes. The energetic dependence of the PX intensity was also obtained.

Original languageEnglish
Pages (from-to)49-55
Number of pages7
JournalNuclear Inst. and Methods in Physics Research, B
Volume21
Issue number1-4
DOIs
Publication statusPublished - 1987

Fingerprint

Silicon
X rays
Crystals
Electrons
Angular distribution
silicon
crystals
electrons
x rays
angular distribution
Single crystals
single crystals

ASJC Scopus subject areas

  • Surfaces, Coatings and Films
  • Instrumentation
  • Surfaces and Interfaces

Cite this

Adishchev, Y. N., Didenko, A. N., Mun, V. V., Pleshkov, G. A., Potylitsin, A. P., Tomchakov, V. K., ... Vorobiev, S. A. (1987). Measurements of parametric X-rays from relativistic electrons in silicon crystals. Nuclear Inst. and Methods in Physics Research, B, 21(1-4), 49-55. https://doi.org/10.1016/0168-583X(87)90138-8

Measurements of parametric X-rays from relativistic electrons in silicon crystals. / Adishchev, Yu N.; Didenko, A. N.; Mun, V. V.; Pleshkov, G. A.; Potylitsin, A. P.; Tomchakov, V. K.; Uglov, S. R.; Vorobiev, S. A.

In: Nuclear Inst. and Methods in Physics Research, B, Vol. 21, No. 1-4, 1987, p. 49-55.

Research output: Contribution to journalArticle

Adishchev, Yu N. ; Didenko, A. N. ; Mun, V. V. ; Pleshkov, G. A. ; Potylitsin, A. P. ; Tomchakov, V. K. ; Uglov, S. R. ; Vorobiev, S. A. / Measurements of parametric X-rays from relativistic electrons in silicon crystals. In: Nuclear Inst. and Methods in Physics Research, B. 1987 ; Vol. 21, No. 1-4. pp. 49-55.
@article{9c2eae99d94d467a9356aa8e951dd12f,
title = "Measurements of parametric X-rays from relativistic electrons in silicon crystals",
abstract = "Spectral and angular distributions of parametric X-rays have been measured for (200-900) MeV electrons from Si single crystal. The parametric X-rays were observed at an angle θ = 19° relative to the beam of electrons, which intersects the (110) or (111) Si crystallographic planes. The energetic dependence of the PX intensity was also obtained.",
author = "Adishchev, {Yu N.} and Didenko, {A. N.} and Mun, {V. V.} and Pleshkov, {G. A.} and Potylitsin, {A. P.} and Tomchakov, {V. K.} and Uglov, {S. R.} and Vorobiev, {S. A.}",
year = "1987",
doi = "10.1016/0168-583X(87)90138-8",
language = "English",
volume = "21",
pages = "49--55",
journal = "Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms",
issn = "0168-583X",
publisher = "Elsevier",
number = "1-4",

}

TY - JOUR

T1 - Measurements of parametric X-rays from relativistic electrons in silicon crystals

AU - Adishchev, Yu N.

AU - Didenko, A. N.

AU - Mun, V. V.

AU - Pleshkov, G. A.

AU - Potylitsin, A. P.

AU - Tomchakov, V. K.

AU - Uglov, S. R.

AU - Vorobiev, S. A.

PY - 1987

Y1 - 1987

N2 - Spectral and angular distributions of parametric X-rays have been measured for (200-900) MeV electrons from Si single crystal. The parametric X-rays were observed at an angle θ = 19° relative to the beam of electrons, which intersects the (110) or (111) Si crystallographic planes. The energetic dependence of the PX intensity was also obtained.

AB - Spectral and angular distributions of parametric X-rays have been measured for (200-900) MeV electrons from Si single crystal. The parametric X-rays were observed at an angle θ = 19° relative to the beam of electrons, which intersects the (110) or (111) Si crystallographic planes. The energetic dependence of the PX intensity was also obtained.

UR - http://www.scopus.com/inward/record.url?scp=0023306670&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0023306670&partnerID=8YFLogxK

U2 - 10.1016/0168-583X(87)90138-8

DO - 10.1016/0168-583X(87)90138-8

M3 - Article

VL - 21

SP - 49

EP - 55

JO - Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

JF - Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

SN - 0168-583X

IS - 1-4

ER -