Measurement of spectral and polarization characteristics of parametric X-rays in a Si crystal

Yu N. Adishchev, V. A. Verzilov, A. P. Potylitsyn, S. R. Uglov, S. A. Vorobyev

Research School of High-Energy Physics

Research output: Contribution to journal › Article › peer-review

Abstract

Spectral distributions of parametric X-rays (PX) have been measured for 900 MeV electrons transmitted through a Si crystal. A displacement of the PX spectral line was observed with the crystal rotation and in scanning PX radiation reflection by a detector. A high degree of linear polarization (P = 0.8) of parametric X-rays was obtained.

Original language	English
Pages (from-to)	130-136
Number of pages	7
Journal	Nuclear Inst. and Methods in Physics Research, B
Volume	44
Issue number	2
DOIs	https://doi.org/10.1016/0168-583X(89)90417-5
Publication status	Published - 1989

ASJC Scopus subject areas

Surfaces, Coatings and Films
Instrumentation
Surfaces and Interfaces

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10.1016/0168-583X(89)90417-5

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@article{9651def65a8e416d8eb2b09472e298bc,

title = "Measurement of spectral and polarization characteristics of parametric X-rays in a Si crystal",

abstract = "Spectral distributions of parametric X-rays (PX) have been measured for 900 MeV electrons transmitted through a Si crystal. A displacement of the PX spectral line was observed with the crystal rotation and in scanning PX radiation reflection by a detector. A high degree of linear polarization (P = 0.8) of parametric X-rays was obtained.",

author = "Adishchev, {Yu N.} and Verzilov, {V. A.} and Potylitsyn, {A. P.} and Uglov, {S. R.} and Vorobyev, {S. A.}",

year = "1989",

doi = "10.1016/0168-583X(89)90417-5",

language = "English",

volume = "44",

pages = "130--136",

journal = "Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms",

issn = "0168-583X",

publisher = "Elsevier",

number = "2",

}

TY - JOUR

T1 - Measurement of spectral and polarization characteristics of parametric X-rays in a Si crystal

AU - Adishchev, Yu N.

AU - Verzilov, V. A.

AU - Potylitsyn, A. P.

AU - Uglov, S. R.

AU - Vorobyev, S. A.

PY - 1989

Y1 - 1989

N2 - Spectral distributions of parametric X-rays (PX) have been measured for 900 MeV electrons transmitted through a Si crystal. A displacement of the PX spectral line was observed with the crystal rotation and in scanning PX radiation reflection by a detector. A high degree of linear polarization (P = 0.8) of parametric X-rays was obtained.

AB - Spectral distributions of parametric X-rays (PX) have been measured for 900 MeV electrons transmitted through a Si crystal. A displacement of the PX spectral line was observed with the crystal rotation and in scanning PX radiation reflection by a detector. A high degree of linear polarization (P = 0.8) of parametric X-rays was obtained.

UR - http://www.scopus.com/inward/record.url?scp=0024945197&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0024945197&partnerID=8YFLogxK

U2 - 10.1016/0168-583X(89)90417-5

DO - 10.1016/0168-583X(89)90417-5

M3 - Article

AN - SCOPUS:0024945197

VL - 44

SP - 130

EP - 136

JO - Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

JF - Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

SN - 0168-583X

IS - 2

ER -