Measurement of spectral and polarization characteristics of parametric X-rays in a Si crystal

Yu N. Adishchev, V. A. Verzilov, A. P. Potylitsyn, S. R. Uglov, S. A. Vorobyev

Research School of High-Energy Physics

Research output: Contribution to journal › Article

Abstract

Spectral distributions of parametric X-rays (PX) have been measured for 900 MeV electrons transmitted through a Si crystal. A displacement of the PX spectral line was observed with the crystal rotation and in scanning PX radiation reflection by a detector. A high degree of linear polarization (P = 0.8) of parametric X-rays was obtained.

Original language	English
Pages (from-to)	130-136
Number of pages	7
Journal	Nuclear Inst. and Methods in Physics Research, B
Volume	44
Issue number	2
DOIs	https://doi.org/10.1016/0168-583X(89)90417-5
Publication status	Published - 1989

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ASJC Scopus subject areas

Surfaces, Coatings and Films
Instrumentation
Surfaces and Interfaces

Cite this

Adishchev, Y. N., Verzilov, V. A., Potylitsyn, A. P., Uglov, S. R., & Vorobyev, S. A. (1989). Measurement of spectral and polarization characteristics of parametric X-rays in a Si crystal. Nuclear Inst. and Methods in Physics Research, B, 44(2), 130-136. https://doi.org/10.1016/0168-583X(89)90417-5

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abstract = "Spectral distributions of parametric X-rays (PX) have been measured for 900 MeV electrons transmitted through a Si crystal. A displacement of the PX spectral line was observed with the crystal rotation and in scanning PX radiation reflection by a detector. A high degree of linear polarization (P = 0.8) of parametric X-rays was obtained.",

author = "Adishchev, {Yu N.} and Verzilov, {V. A.} and Potylitsyn, {A. P.} and Uglov, {S. R.} and Vorobyev, {S. A.}",

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AU - Adishchev, Yu N.

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AU - Potylitsyn, A. P.

AU - Uglov, S. R.

AU - Vorobyev, S. A.

PY - 1989

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N2 - Spectral distributions of parametric X-rays (PX) have been measured for 900 MeV electrons transmitted through a Si crystal. A displacement of the PX spectral line was observed with the crystal rotation and in scanning PX radiation reflection by a detector. A high degree of linear polarization (P = 0.8) of parametric X-rays was obtained.

AB - Spectral distributions of parametric X-rays (PX) have been measured for 900 MeV electrons transmitted through a Si crystal. A displacement of the PX spectral line was observed with the crystal rotation and in scanning PX radiation reflection by a detector. A high degree of linear polarization (P = 0.8) of parametric X-rays was obtained.

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10.1016/0168-583X(89)90417-5