Abstract
Spectral distributions of parametric X-rays (PX) have been measured for 900 MeV electrons transmitted through a Si crystal. A displacement of the PX spectral line was observed with the crystal rotation and in scanning PX radiation reflection by a detector. A high degree of linear polarization (P = 0.8) of parametric X-rays was obtained.
| Original language | English |
|---|---|
| Pages (from-to) | 130-136 |
| Number of pages | 7 |
| Journal | Nuclear Inst. and Methods in Physics Research, B |
| Volume | 44 |
| Issue number | 2 |
| DOIs | |
| Publication status | Published - 1989 |
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ASJC Scopus subject areas
- Surfaces, Coatings and Films
- Instrumentation
- Surfaces and Interfaces
Cite this
Measurement of spectral and polarization characteristics of parametric X-rays in a Si crystal. / Adishchev, Yu N.; Verzilov, V. A.; Potylitsyn, A. P.; Uglov, S. R.; Vorobyev, S. A.
In: Nuclear Inst. and Methods in Physics Research, B, Vol. 44, No. 2, 1989, p. 130-136.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Measurement of spectral and polarization characteristics of parametric X-rays in a Si crystal
AU - Adishchev, Yu N.
AU - Verzilov, V. A.
AU - Potylitsyn, A. P.
AU - Uglov, S. R.
AU - Vorobyev, S. A.
PY - 1989
Y1 - 1989
N2 - Spectral distributions of parametric X-rays (PX) have been measured for 900 MeV electrons transmitted through a Si crystal. A displacement of the PX spectral line was observed with the crystal rotation and in scanning PX radiation reflection by a detector. A high degree of linear polarization (P = 0.8) of parametric X-rays was obtained.
AB - Spectral distributions of parametric X-rays (PX) have been measured for 900 MeV electrons transmitted through a Si crystal. A displacement of the PX spectral line was observed with the crystal rotation and in scanning PX radiation reflection by a detector. A high degree of linear polarization (P = 0.8) of parametric X-rays was obtained.
UR - http://www.scopus.com/inward/record.url?scp=0024945197&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=0024945197&partnerID=8YFLogxK
U2 - 10.1016/0168-583X(89)90417-5
DO - 10.1016/0168-583X(89)90417-5
M3 - Article
AN - SCOPUS:0024945197
VL - 44
SP - 130
EP - 136
JO - Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
JF - Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
SN - 0168-583X
IS - 2
ER -