Measurement of spectral and polarization characteristics of parametric X-rays in a Si crystal

Yu N. Adishchev, V. A. Verzilov, A. P. Potylitsyn, S. R. Uglov, S. A. Vorobyev

Research output: Contribution to journalArticle

45 Citations (Scopus)

Abstract

Spectral distributions of parametric X-rays (PX) have been measured for 900 MeV electrons transmitted through a Si crystal. A displacement of the PX spectral line was observed with the crystal rotation and in scanning PX radiation reflection by a detector. A high degree of linear polarization (P = 0.8) of parametric X-rays was obtained.

Original languageEnglish
Pages (from-to)130-136
Number of pages7
JournalNuclear Inst. and Methods in Physics Research, B
Volume44
Issue number2
DOIs
Publication statusPublished - 1989

Fingerprint

polarization characteristics
Polarization
X rays
Crystals
crystals
x rays
linear polarization
line spectra
Detectors
Scanning
Radiation
scanning
Electrons
detectors
radiation
electrons

ASJC Scopus subject areas

  • Surfaces, Coatings and Films
  • Instrumentation
  • Surfaces and Interfaces

Cite this

Measurement of spectral and polarization characteristics of parametric X-rays in a Si crystal. / Adishchev, Yu N.; Verzilov, V. A.; Potylitsyn, A. P.; Uglov, S. R.; Vorobyev, S. A.

In: Nuclear Inst. and Methods in Physics Research, B, Vol. 44, No. 2, 1989, p. 130-136.

Research output: Contribution to journalArticle

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AU - Vorobyev, S. A.

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